Method and Device for Measuring and Optimizing an Optoelectronic Component
    1.
    发明申请
    Method and Device for Measuring and Optimizing an Optoelectronic Component 审中-公开
    用于测量和优化光电元件的方法和装置

    公开(公告)号:US20160003890A1

    公开(公告)日:2016-01-07

    申请号:US14769788

    申请日:2014-03-06

    CPC classification number: G01R31/2635 G01N2201/061 G01R31/025 H05B37/0227

    Abstract: A method can be used for measuring at least one optoelectronic component arranged on a connection carrier. The method includes exciting an electromagnetic oscillating circuit, which is formed by the optoelectronic component and the connection carrier, thus exciting the optoelectronic component in such a way that the optoelectronic component emits electromagnetic radiation, and measuring at least one electro-optical property of the optoelectronic component.

    Abstract translation: 一种方法可用于测量布置在连接载体上的至少一个光电子部件。 该方法包括激励由光电子部件和连接载体形成的电磁振荡电路,从而以光电子部件发射电磁辐射的方式激发光电子部件,并且测量光电子学的至少一个电光学特性 零件。

    Method and device for inspecting an optoelectronic component arranged on a connection board

    公开(公告)号:US10288671B2

    公开(公告)日:2019-05-14

    申请号:US15547948

    申请日:2016-01-14

    Abstract: A method and a device for inspecting an optoelectronic component are disclosed. In an embodiment, the method includes exciting at least one electromagnetic resonant circuit, formed by the at least one optoelectronic component and the connection board, such that the at least one optoelectronic component emits electromagnetic radiation, wherein exciting the electromagnetic resonant circuit comprises applying an electrical alternating voltage in the electromagnetic resonant circuit by generating a temporally variable electromagnetic alternating field by a first coil and a second coil, wherein the first coil and the second coil are movable with respect to the connection board.

    Method and Device for Inspecting an Optoelectronic Component

    公开(公告)号:US20180024185A1

    公开(公告)日:2018-01-25

    申请号:US15547948

    申请日:2016-01-14

    CPC classification number: G01R31/2635 G01R31/2831

    Abstract: A method and a device for inspecting an optoelectronic component are disclosed. In an embodiment, the method includes exciting at least one electromagnetic resonant circuit, formed by the at least one optoelectronic component and the connection board, such that the at least one optoelectronic component emits electromagnetic radiation, wherein exciting the electromagnetic resonant circuit comprises applying an electrical alternating voltage in the electromagnetic resonant circuit by generating a temporally variable electromagnetic alternating field by a first coil and a second coil, wherein the first coil and the second coil are movable with respect to the connection board.

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