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公开(公告)号:US20210390227A1
公开(公告)日:2021-12-16
申请号:US17323941
申请日:2021-05-18
Inventor: HIROKO YOSHIDA , NOBUO HARA , KOICHI WAKITANI , AKIHISA NAKAHASHI
IPC: G06F30/20 , B23K26/244 , B23K26/32
Abstract: An experiment of processing a device is performed to acquire type 1 information and type 2 information indicating processing conditions, and type 3 information and type 4 information indicating results of the processing, derive a first relation between the type 1 information, the type 2 information, and the type 3 information, and a second relation between the type 1 information, the type 2 information, and the type 4 information, and generate and output a model that estimates the type 4 information indicating a result of the processing by using the first relation and the second relation with the type 2 information and the type 3 information that are measured during the processing as inputs.
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公开(公告)号:US20230070635A1
公开(公告)日:2023-03-09
申请号:US17822626
申请日:2022-08-26
Inventor: NOBUO HARA , HIROKO YOSHIDA , AKIHISA NAKAHASHI
IPC: G05B19/418
Abstract: Experimental device machining is performed according to plan information including first type information indicating a first type condition of the experimental device machining and second type information indicating a second type condition of the experimental device machining. Third type information indicating a third type result and fourth type information indicating a fourth type result are acquired. Extended plan information is acquired in which a uniformity of extended second type information and extended third type information is equal to or greater than a threshold value. Extended third type information indicating a third type result and extended fourth type information indicating a fourth type result are acquired by performing the experimental device machining according to the extended plan information. An extended first relationship is derived that is a relationship between extended first type information, the extended second type information, and the extended third type information. An extended second relationship is derived that is a relationship between the extended first type information, the extended second type information, and the extended fourth type information. A model for estimating fourth type information indicating a fourth type result of actual device machining by receiving the second type information measured during the actual device machining and the third type information measured during the actual device machining and using the extended first relationship and the extended second relationship is generated. The model is output.
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公开(公告)号:US20220067015A1
公开(公告)日:2022-03-03
申请号:US17396647
申请日:2021-08-06
Inventor: NOBUO HARA , MIKIO USHIODA , AKIHISA NAKAHASHI
IPC: G06F16/22
Abstract: An information processing method includes: creating a first table; calculating a first response surface using the first table in which an object variable is recorded, the object variable acquired when experimental conditions of a first control factor is fixed to a first level value; adding the experimental conditions of the first control factor in which the first level value is set to the first table when the first response surface does not include a target value related to the object variable; creating a second table by adding a plurality of combinations of the experimental conditions for each of the plurality of control factors in which a first plurality of level values are set and the first control factor in which a second plurality of level values are set to the first table; calculating a second response surface including the target value using the second table; and outputting the second response surface.
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