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公开(公告)号：US20250093827A1
公开(公告)日：2025-03-20
申请号：US18963686
申请日：2024-11-28
Inventor： MIKIO USHIODA , NOBUO HARA
Abstract: Evaluation device (100) is a device that evaluates, by Bayesian optimization, unknown characteristic points corresponding to a plurality of candidate control points at a second time following a first time based on known characteristic points corresponding to controlled control points at the first time, the device including: reception controller (10) that acquires control result data (222) indicating the controlled control points at the first time and the known characteristic points at the first time, purpose data (212) indicating an optimization purpose, constraint condition data (213) indicating a constraint condition, and region reduction rule data (214); evaluation value calculating unit (12) that calculates an evaluation value of each of the plurality of unknown characteristic points based on control result data (222), purpose data (212), constraint condition data (213), and region reduction rule data (214); and evaluation value output unit (13) that outputs an evaluation value.
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公开(公告)号：US20220084177A1
公开(公告)日：2022-03-17
申请号：US17395966
申请日：2021-08-06
Inventor： NOBUO HARA , TAKESHI YAMASAKI , KOICHI WAKITANI , TOMOYUKI ISHIKAWA , SEITA TAKAHASHI
Abstract: An information processing method includes a step of calculating a position of a feature corresponding to a trace in a first coordinate system defined with reference to a field of view of an image, a step of calculating a position of the feature corresponding to the trace in a second coordinate system defined with reference to a position of a workpiece recorded in the image, a step of calculating a size of a first distribution of the position of the feature corresponding to the trace in the first coordinate system and a size of a second distribution of the position of the feature corresponding to the trace in the second coordinate system, and a step of outputting information indicating that the feature corresponding to the trace is the trace formed on the surface of the workpiece in the machining process, when a difference between the size of the first distribution and the size of the second distribution exceeds a first predetermined value, and outputting information indicating that the feature corresponding to the trace is a false detection of the trace in the inspection process, when the difference is equal to or less than the first predetermined value.
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公开(公告)号：US20250004461A1
公开(公告)日：2025-01-02
申请号：US18830634
申请日：2024-09-11
Inventor： MIKIO USHIODA , NOBUO HARA
IPC: G05B23/02
Abstract: Evaluation device (100A) is a device that evaluates, by Bayesian optimization, an unknown characteristic point corresponding to a candidate experimental point based on a known characteristic point corresponding to an experimented experimental point, the evaluation device including: reception controller (10A) that acquires experimental result data (222) indicating the experimented experimental point and the known characteristic point, objective data (212) indicating an optimization objective, constraint condition data (213) indicating a constraint condition, and region reduction rule data (214); evaluation value calculator (12A) that calculates an evaluation value of the unknown characteristic point based on experimental result data (222), objective data (212), constraint condition data (213), and region reduction rule data (214); and evaluation value output unit (13) that outputs the evaluation value, in which evaluation value calculator (12A) gives a weighting according to a degree of conformity of the constraint condition to the evaluation value for at least one objective characteristic.
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公开(公告)号：US20210390227A1
公开(公告)日：2021-12-16
申请号：US17323941
申请日：2021-05-18
Inventor： HIROKO YOSHIDA , NOBUO HARA , KOICHI WAKITANI , AKIHISA NAKAHASHI
IPC: G06F30/20 , B23K26/244 , B23K26/32
Abstract: An experiment of processing a device is performed to acquire type 1 information and type 2 information indicating processing conditions, and type 3 information and type 4 information indicating results of the processing, derive a first relation between the type 1 information, the type 2 information, and the type 3 information, and a second relation between the type 1 information, the type 2 information, and the type 4 information, and generate and output a model that estimates the type 4 information indicating a result of the processing by using the first relation and the second relation with the type 2 information and the type 3 information that are measured during the processing as inputs.
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公开(公告)号：US20230070635A1
公开(公告)日：2023-03-09
申请号：US17822626
申请日：2022-08-26
Inventor： NOBUO HARA , HIROKO YOSHIDA , AKIHISA NAKAHASHI
IPC: G05B19/418
Abstract: Experimental device machining is performed according to plan information including first type information indicating a first type condition of the experimental device machining and second type information indicating a second type condition of the experimental device machining. Third type information indicating a third type result and fourth type information indicating a fourth type result are acquired. Extended plan information is acquired in which a uniformity of extended second type information and extended third type information is equal to or greater than a threshold value. Extended third type information indicating a third type result and extended fourth type information indicating a fourth type result are acquired by performing the experimental device machining according to the extended plan information. An extended first relationship is derived that is a relationship between extended first type information, the extended second type information, and the extended third type information. An extended second relationship is derived that is a relationship between the extended first type information, the extended second type information, and the extended fourth type information. A model for estimating fourth type information indicating a fourth type result of actual device machining by receiving the second type information measured during the actual device machining and the third type information measured during the actual device machining and using the extended first relationship and the extended second relationship is generated. The model is output.
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Patent Agency Ranking
公开(公告)号：US20220067015A1
公开(公告)日：2022-03-03
申请号：US17396647
申请日：2021-08-06
Inventor： NOBUO HARA , MIKIO USHIODA , AKIHISA NAKAHASHI
IPC: G06F16/22
Abstract: An information processing method includes: creating a first table; calculating a first response surface using the first table in which an object variable is recorded, the object variable acquired when experimental conditions of a first control factor is fixed to a first level value; adding the experimental conditions of the first control factor in which the first level value is set to the first table when the first response surface does not include a target value related to the object variable; creating a second table by adding a plurality of combinations of the experimental conditions for each of the plurality of control factors in which a first plurality of level values are set and the first control factor in which a second plurality of level values are set to the first table; calculating a second response surface including the target value using the second table; and outputting the second response surface.
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公开(公告)号：US20250103925A1
公开(公告)日：2025-03-27
申请号：US18977744
申请日：2024-12-11
Inventor： YIRAN JIANG , YUICHIRO SADANAGA , NOBUO HARA
Abstract: Data analysis device (1) includes data acquisition unit (10) that acquires a plurality of explanatory variables X and E and objective variable Y that can take different values depending on a time, first model derivation unit (30) that performs multiple regression analysis by using the plurality of explanatory variables X and E and objective variable Y and derives first model M1 indicating a relationship between the plurality of explanatory variables X and E and objective variable Y, change point detection unit (50) that detects change point Tc that is a time when a predetermined explanatory variable (for example, E) among the plurality of explanatory variables X and E changes beyond a predetermined range, and second model derivation unit (60) that corrects first model M1 based on predetermined explanatory variable E starting from change point Tc and derives second model M2 that is a corrected model.
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公开(公告)号：US20220391737A1
公开(公告)日：2022-12-08
申请号：US17664418
申请日：2022-05-22
Inventor： MIKIO USHIODA , NOBUO HARA
Abstract: An evaluation device is a device that evaluates, by Bayesian optimization, an unknown characteristic point corresponding to a candidate experimental point based on a known characteristic point corresponding to an experimented experimental point, the device including: a reception controller that acquires experimental result data indicating the experimented experimental point and the known characteristic point, objective data indicating an optimization objective, and constraint-condition data indicating a constraint condition; an evaluation value calculator that calculates an evaluation value of an unknown characteristic point based on the experimental result data, the objective data, and the constraint-condition data; and an evaluation value output unit that outputs the evaluation value, in which the evaluation value calculator gives weighting according to a degree of compatibility of the constraint condition to an evaluation value for at least one objective characteristic.
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公开(公告)号：US20230409664A1
公开(公告)日：2023-12-21
申请号：US18460647
申请日：2023-09-04
Inventor： SHINGO YAMAGUCHI , MIRAI SHIMAGUCHI , YUICHIRO SADANAGA , NOBUO HARA
IPC: G06F17/11
CPC classification number: G06F17/11
Abstract: Data analysis device 1 includes: a difference value calculator that calculates, in data section (i, i+1) in which ith data at a predetermined date and time among the plurality of pieces of data is used as a start point value and (i+1)th data at a date and time after the predetermined date and time is used as an end point value, explanatory variable difference value ΔX that is a difference between start point value X(i) of explanatory variable X included in the ith data and end point value X(i+1) of explanatory variable X included in the (i+1)th data, and target variable difference value ΔY that is a difference between start point value Y(i) of target variable Y included in the ith data and end point value Y(i+1) of target variable Y included in the (i+1) data; and a difference model derivation unit that derives difference model M indicating a relationship between explanatory variable difference value ΔX and target variable difference value ΔY based on a plurality of the explanatory variable difference values ΔX and a plurality of the target variable difference values ΔY.
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公开(公告)号：US20220382247A1
公开(公告)日：2022-12-01
申请号：US17662236
申请日：2022-05-06
Inventor： HIROKO YOSHIDA , NOBUO HARA
IPC: G05B19/408 , B23K9/095 , G05B19/18 , G05B19/4063
Abstract: A processor performs an experiment of machining a device to acquire first-type and second-type information each indicating conditions of the experiment of machining and third-type and fourth-type information each indicating a result of the experiment of machining (S401). The processor derives a first expression and a second expression, where the first expression receives first-type and second-type information as inputs and outputs third-type information as more than one solution, and the second expression receives first-type and second-type information as inputs and outputs fourth-type information. The processor derives more than one third expression from the first expression, where the more than one third expression each receives second-type and third-type information as inputs and outputs first-type information (S402). The processor receives second-type and third-type information each measured in machining as inputs and outputs fourth-type information indicating a result of machining using the second expression and the more than one third expression (S403).
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