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公开(公告)号:US20210390227A1
公开(公告)日:2021-12-16
申请号:US17323941
申请日:2021-05-18
Inventor: HIROKO YOSHIDA , NOBUO HARA , KOICHI WAKITANI , AKIHISA NAKAHASHI
IPC: G06F30/20 , B23K26/244 , B23K26/32
Abstract: An experiment of processing a device is performed to acquire type 1 information and type 2 information indicating processing conditions, and type 3 information and type 4 information indicating results of the processing, derive a first relation between the type 1 information, the type 2 information, and the type 3 information, and a second relation between the type 1 information, the type 2 information, and the type 4 information, and generate and output a model that estimates the type 4 information indicating a result of the processing by using the first relation and the second relation with the type 2 information and the type 3 information that are measured during the processing as inputs.
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公开(公告)号:US20230070635A1
公开(公告)日:2023-03-09
申请号:US17822626
申请日:2022-08-26
Inventor: NOBUO HARA , HIROKO YOSHIDA , AKIHISA NAKAHASHI
IPC: G05B19/418
Abstract: Experimental device machining is performed according to plan information including first type information indicating a first type condition of the experimental device machining and second type information indicating a second type condition of the experimental device machining. Third type information indicating a third type result and fourth type information indicating a fourth type result are acquired. Extended plan information is acquired in which a uniformity of extended second type information and extended third type information is equal to or greater than a threshold value. Extended third type information indicating a third type result and extended fourth type information indicating a fourth type result are acquired by performing the experimental device machining according to the extended plan information. An extended first relationship is derived that is a relationship between extended first type information, the extended second type information, and the extended third type information. An extended second relationship is derived that is a relationship between the extended first type information, the extended second type information, and the extended fourth type information. A model for estimating fourth type information indicating a fourth type result of actual device machining by receiving the second type information measured during the actual device machining and the third type information measured during the actual device machining and using the extended first relationship and the extended second relationship is generated. The model is output.
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公开(公告)号:US20220382247A1
公开(公告)日:2022-12-01
申请号:US17662236
申请日:2022-05-06
Inventor: HIROKO YOSHIDA , NOBUO HARA
IPC: G05B19/408 , B23K9/095 , G05B19/18 , G05B19/4063
Abstract: A processor performs an experiment of machining a device to acquire first-type and second-type information each indicating conditions of the experiment of machining and third-type and fourth-type information each indicating a result of the experiment of machining (S401). The processor derives a first expression and a second expression, where the first expression receives first-type and second-type information as inputs and outputs third-type information as more than one solution, and the second expression receives first-type and second-type information as inputs and outputs fourth-type information. The processor derives more than one third expression from the first expression, where the more than one third expression each receives second-type and third-type information as inputs and outputs first-type information (S402). The processor receives second-type and third-type information each measured in machining as inputs and outputs fourth-type information indicating a result of machining using the second expression and the more than one third expression (S403).
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