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公开(公告)号:US11798987B2
公开(公告)日:2023-10-24
申请号:US17421379
申请日:2020-01-08
发明人: Ivo Rangelow , Xiang-Qian Zhou , Dimitre Karpuzov
IPC分类号: H01L29/06 , H01L21/265 , H01L21/266 , H01L29/16 , H01L29/66 , H01L29/861 , H01L29/868
CPC分类号: H01L29/0657 , H01L21/266 , H01L21/26506 , H01L29/1602 , H01L29/6603 , H01L29/6609 , H01L29/66136 , H01L29/868 , H01L29/8611 , H01L2021/26573
摘要: The present invention is related to a substrate (10) for a controlled implantation of ions (80) into a bulk (20), the substrate (10) comprising the bulk (20) composed of a crystalline first material (70), the bulk (20) comprising an implantation region (28) and a surface (22), wherein the implantation region (28) is located within the bulk (20) and along an implantation direction (82) at an implantation depth (26) below an implantation area (24) on the surface (10) of the bulk (20). Further, the present invention is related to a method of preparing a substrate (10) for a controlled implantation of ions (80) into a bulk (20), preferably the aforementioned substrate (10), the substrate (10) comprising the bulk (20) composed of a crystalline first material (70), the bulk (20) comprising an implantation region (28) and the surface (22), wherein the implantation region (28) is located within the bulk (20) and along an implantation direction (82) at an implantation depth (26) below an implantation area (24) on the surface (22) of the bulk (20).