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公开(公告)号:US20190289238A1
公开(公告)日:2019-09-19
申请号:US16431302
申请日:2019-06-04
Inventor: Makoto IKUMA , Hiroyuki Amikawa , Takayasu Kito , Shinichi Ogita , Junichi Matsuo , Yasuyuki Endoh , Katsumi Tokuyama , Tetsuya Abe
Abstract: A solid-state imaging apparatus includes a pixel array, a column processor, and a test signal generating circuit that generates a first digital signal for testing purposes. The test signal generating circuit generates the first digital signal within one horizontal scanning period. The column processor converts a first analog signal, that is converted from the first digital signal, to a second digital signal within the one horizontal scanning period.
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公开(公告)号:US10685997B2
公开(公告)日:2020-06-16
申请号:US16431302
申请日:2019-06-04
Inventor: Makoto Ikuma , Hiroyuki Amikawa , Takayasu Kito , Shinichi Ogita , Junichi Matsuo , Yasuyuki Endoh , Katsumi Tokuyama , Tetsuya Abe
IPC: H04N5/378 , H01L27/146 , H01L27/142 , H04N5/225 , H04N5/232 , H04N5/235 , H04N5/363 , H04N17/00 , H04N5/355 , H04N5/353 , B60R11/04 , B60R11/00
Abstract: A solid-state imaging apparatus includes a pixel array, a column processor, and a test signal generating circuit that generates a first digital signal for testing purposes. The test signal generating circuit generates the first digital signal within one horizontal scanning period. The column processor converts a first analog signal, that is converted from the first digital signal, to a second digital signal within the one horizontal scanning period.
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