Abstract:
A state detection apparatus includes a state detection sensor that is attached to an architecture and that detects a state of the architecture, a power supp that generates power on the basis of vibration of the architecture, and a controller that controls the state detection sensor and the power supp. The controller supplies power to the state detection sensor to drive the state detection sensor in a case where a voltage by power generation exceeds a first threshold (threshold voltage), and acquires state information to be used for diagnosing the state of the architecture on the basis of a signal indicating a detection result received from the state detection sensor.
Abstract:
An encapsulated semiconductor device includes: a first conduction path formative plate; a second conduction path formative plate joined to the first conduction path formative plate; a power element bonded to the first conduction path formative plate; a heatsink held by the first conduction path formative plate with an insulation sheet interposed between the heatsink and the first conduction path formative plate; and an encapsulation resin configured to encapsulate the first and second conduction path formative plates. A through hole or a lead gap is formed in a region of the first conduction path formative plate in contact with the insulation sheet. The insulation sheet is press-fitted into the through hole or the lead gap.