公开(公告)号：US12073549B2

公开(公告)日：2024-08-27

申请号：US17679298

申请日：2022-02-24

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Yousuke Irie ,  Hirotsugu Inoue ,  Michiyasu Hirota

IPC: G06T7/00 ,  G01K11/26

CPC classification number: G06T7/0004 ,  G01K11/26 ,  G06T2207/20212 ,  G06T2207/30108

Abstract: A stress analysis device includes: an imaging element that obtains temperature images over a same time range for a same region of an object; a feature point extractor that extracts a feature point in each of the temperature images; a projection transformer that performs projective transformation on each of the temperature images to align the feature point in the temperature images, and aligns the temperature images with respect to a temperature image being a reference; a pixel rearranger that rearranges a pixel array of each of the temperature images subjected to the projective transformation with respect to a pixel array of the temperature image that is the reference; a stress converter that obtains a stress image by multiplying each of the temperature images after pixel rearrangement by a stress conversion coefficient; and an additional averaging part that obtains an additional averaging stress image by adding and averaging the stress images.