INFRARED SENSOR AND INFRARED SENSOR DEVICE EQUIPPED WITH SAME

    公开(公告)号:US20220196481A1

    公开(公告)日:2022-06-23

    申请号:US17598862

    申请日:2020-02-26

    Abstract: A film structural component is supported by a substrate. The film structural component includes a plurality of thermal infrared detectors arranged in an array. Each of the plurality of thermal infrared detectors includes a thermopile having a plurality of hot junctions and a plurality of cold junctions. An infrared sensor further includes a plurality of heaters and at least one thermometer. The plurality of heaters are provided on the first principal surface of the substrate. The at least one thermometer is provided on the first principal surface of the substrate and is configured to detect a temperature of the substrate. Each of the plurality of heaters faces another heater of the plurality of heaters via a region including the plurality of thermal infrared detectors in plan view in the thickness direction of the substrate.

    INFRARED PROCESSING SYSTEM, INFRARED SENSOR SYSTEM, INFRARED PROCESSING METHOD, AND PROGRAM

    公开(公告)号:US20220408037A1

    公开(公告)日:2022-12-22

    申请号:US17777484

    申请日:2020-09-16

    Abstract: An infrared processing system includes a first thermal image generating unit, an object extracting unit, a second thermal image generating unit, and an object temperature calculating unit. The first thermal image generating unit generates, using a first temperature correction value, a first thermal image based on the output signal of the image sensor. The object extracting unit extracts the object from the first thermal image. The second thermal image generating unit generates, using a second temperature correction value corresponding to the object that has been extracted by the object extracting unit, a second thermal image based on the output signal of the image sensor. The object temperature calculating unit calculates, based on the second thermal image that has been generated by the second thermal image generating unit, a temperature of the object that has been extracted by the object extracting unit.

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