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公开(公告)号：US20210400079A1
公开(公告)日：2021-12-23
申请号：US17466207
申请日：2021-09-03
Inventor： Hiroshi AMANO , Yusuke NEMOTO , Minehisa NAGATA , Yosuke TAJIKA
Abstract: A risk analyzer analyzing risk of a system including N (natural number greater than or equal to 2) elements connected includes: an inputter receiving, as inputs, a cost of each N element for increasing a safety degree against a threat to security, a connection relationship of at least part of the N elements, an entry point being an element serving as an entry to the system, and a defense target being an element protected in the system; an identifier identifying, based on the cost of each N element and the connection relationship, a target element of one or more elements requiring a minimum total cost necessary for cutting off a target path from the entry point to the defense target by increasing a safety degree of one or more elements on the target path to a threshold value or more; and an outputter outputting element information indicating the target element.
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公开(公告)号：US20220300883A1
公开(公告)日：2022-09-22
申请号：US17838227
申请日：2022-06-12
Inventor： Daijiroh ICHIMURA , Yoshiyuki OKIMOTO , Hidehiko SHIN , Akira MINEGISHI , Yosuke TAJIKA
IPC: G06Q10/06
Abstract: A quality estimation device for generating information on quality with which a plurality of unit products are obtained by using a plurality of facilities to pass at least one step, includes: a memory that stores quality control data associating the facilities passed for each of the unit products in the step when the unit products are obtained, with quality for the obtained unit products; and a circuit that controls calculation processing based on the quality control data stored in the memory. The circuit extracts a plurality of pass records from the quality control data, the plurality of pass records each indicating a series of facilities passed by a unit product in the plurality of unit products and quality for the unit product, and generates facility quality information indicating quality with respect to a facility in the plurality of facilities by the calculation processing, based on the extracted pass records.
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公开(公告)号：US20220100179A1
公开(公告)日：2022-03-31
申请号：US17545506
申请日：2021-12-08
Inventor： Hiroshi AMANO , Yosuke TAJIKA
IPC: G05B19/418 , H04L29/06
Abstract: Provided is a product manufacturing system including: a manufacture control apparatus configured to hold manufacturing data on a product; a virtual manufacturing apparatus configured to virtually manufacture the product by simulation, based on the manufacturing data on the product in the manufacture control apparatus; a physical manufacturing apparatus configured to physically manufacture the product based on the manufacturing data in the manufacture control apparatus; an abnormality determination unit configured to determine whether there is an abnormality in the virtual manufacture of the product by the virtual manufacturing apparatus. When it is determined there is no abnormality from the virtual manufacture of the product, the physical manufacturing apparatus physically manufactures the product.
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公开(公告)号：US20210264026A1
公开(公告)日：2021-08-26
申请号：US16973898
申请日：2019-06-07
Inventor： Hiroshi AMANO , Narumi ATSUTA , Noriaki HAMADA , Yosuke TAJIKA , Nobutaka KAWAGUCHI , Yuichi HIGUCHI , Taichi SHIMIZU
IPC: G06F21/55
Abstract: An unauthorized communication detection device that detects unauthorized communication in a manufacturing system that manufactures products includes: an obtainer that obtains operation information of the manufacturing system; a storage that stores element information indicating one or more target elements among a plurality of elements related to manufacturing of the products; a specifier that specifies, for each of a plurality of communications performed in the manufacturing system, an element corresponding to the communication, based on the operation information; a calculator that calculates an abnormal degree of each of one or more communications, which satisfy that the element specified by the specifier is included in the one or more target elements indicated by the element information, among the plurality of communications; and a determiner that determines that, when an abnormal degree calculated by the calculator is larger than a threshold value, a communication corresponding to the abnormal degree is the unauthorized communication.
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Patent Agency Ranking
公开(公告)号：US20200021610A1
公开(公告)日：2020-01-16
申请号：US16580853
申请日：2019-09-24
Inventor： Hiroshi AMANO , Yosuke TAJIKA , Yuichi HIGUCHI
Abstract: An abnormality in a manufacturing system is detected without extensive modification to the existing manufacturing systems. The data analysis device includes: a receiver configured to receive a packet transmitted between a manufacture control device and a manufacturing device; an analyzer configured to obtain the type of data included in a payload of the received packet from an IP address and a port number included in a header of the packet; a selector configured to select, based on the type of the data obtained by the analyzer, a syntax or rule corresponding to the type of the data; and a determiner configured to determine that the manufacturing system has an abnormality if the data included in the payload does not follow the syntax or rule corresponding to the type of the data.
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公开(公告)号：US20230083876A1
公开(公告)日：2023-03-16
申请号：US17990669
申请日：2022-11-19
Inventor： Yoshiyuki OKIMOTO , Daijiroh ICHIMURA , Akira MINEGISHI , Yosuke TAJIKA
IPC: G05B19/418 , G06Q50/04
Abstract: A data analysis device, for analyzing efficiency of an assembly line operation including processes, includes: an input interface configured to acquire log data indicating a history of the processes respectively performed for each time of the assembly line operation; and a control circuit configured to generate analysis information indicating an analysis result of the history indicated by the log data, based on information generated by a probability model to calculate probability distribution for the assembly line operation. The probability model is configured to: generate process efficiency distribution indicating probability distribution of efficiency for each process in the assembly line operation, and variation factor distribution indicating probability distribution of a factor probable to vary the efficiency of the assembly line operation in each process; and generate work efficiency distribution indicating probability distribution of the efficiency of the assembly line operation, based on the process efficiency distribution and the variation factor distribution.
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公开(公告)号：US20210397702A1
公开(公告)日：2021-12-23
申请号：US17466289
申请日：2021-09-03
Inventor： Hiroshi AMANO , Yusuke NEMOTO , Minehisa NAGATA , Yosuke TAJIKA
IPC: G06F21/55
Abstract: A risk analyzer analyzing a risk of a system including N (natural number greater than or equal to 2) elements connected includes: an inputter receiving, as inputs, a degree of safety of each N element against a threat to security, a connection relationship of the N elements, an entry point being an element serving as an entry to the system, and a defense target being an element protected in the system; an identifier identifying, among one or more paths from the entry point to the defense target, based on the degrees of safety and the connection relationship of the N elements, a target path in which a total sum of the degrees of safety of elements passed while the target path extends from the entry point to the defense target is lower than a threshold value; and an outputter outputting path information on the target path.
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公开(公告)号：US20210208578A1
公开(公告)日：2021-07-08
申请号：US16973917
申请日：2019-06-07
Inventor： Hiroshi AMANO , Narumi ATSUTA , Noriaki HAMADA , Yosuke TAJIKA , Nobutaka KAWAGUCHI , Yuichi HIGUCHI , Taichi SHIMIZU
IPC: G05B23/02 , G05B19/418
Abstract: An abnormality analysis device including: an overall information obtainer that obtains overall information indicating an overall feature amount of a manufacturing system; an overall abnormal degree calculator that calculates an overall abnormal degree that is an abnormal degree of a whole of the manufacturing system by statistically processing the overall information; an individual information obtainer that obtains individual information indicating a feature amount of each of the plurality of constituent elements; an individual abnormal degree calculator that calculates an individual abnormal degree that is an abnormal degree of each of the plurality of constituent elements by statistically processing the individual information; and a determiner that determines whether or not the overall abnormal degree exceeds a threshold value, wherein the individual abnormal degree calculator calculates the individual abnormal degree when the determiner determines that the overall abnormal degree exceeds the threshold value.
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9.发明申请公开(公告)号：US20190317483A1
公开(公告)日：2019-10-17
申请号：US16343269
申请日：2017-10-20
Inventor： Hiroshi AMANO , Yosuke TAJIKA
IPC: G05B19/418 , H04L29/06
Abstract: Provided is a product manufacturing system including: a manufacture control apparatus configured to hold manufacturing data on a product; a virtual manufacturing apparatus configured to virtually manufacture the product by simulation, based on the manufacturing data on the product in the manufacture control apparatus; a physical manufacturing apparatus configured to physically manufacture the product based on the manufacturing data in the manufacture control apparatus; an abnormality determination unit configured to determine whether there is an abnormality in the virtual manufacture of the product by the virtual manufacturing apparatus. When it is determined there is no abnormality from the virtual manufacture of the product, the physical manufacturing apparatus physically manufactures the product.
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