公开(公告)号：US20190246026A1

公开(公告)日：2019-08-08

申请号：US15890364

申请日：2018-02-07

Applicant: PixArt Imaging Inc.

Inventor： Kei Tee TIEW ,  Shan Chong TAN

IPC: H04N5/235 ,  G06K9/62 ,  H04N5/369 ,  H04N5/378 ,  H04N5/225 ,  G01K3/00 ,  G01K13/00

Abstract: A method of an image sensor device includes: using a pixel array of the image sensor device to sense and generate at least one dark image; computing pixel statistics according to the at least one dark image; and, determining which one of a plurality of temperature ranges a temperature of the image sensor device falls within according to the pixel statistics.

公开(公告)号：US20200059213A1

公开(公告)日：2020-02-20

申请号：US16104954

申请日：2018-08-20

Applicant: PixArt Imaging Inc.

Inventor： Balasubramaniam Shammugasamy ,  Kei Tee TIEW

IPC: H03F3/45 ,  H03F3/21

Abstract: An amplifier circuit comprising: a first amplifier, comprising a voltage input terminal and a voltage output terminal; a voltage offset providing circuit, comprising a first terminal coupled to a first predetermined voltage source, a second terminal coupled to the voltage output terminal, and a third terminal, wherein a voltage at the third terminal is higher than a voltage at the second terminal by an offset voltage; and a voltage control capacitor, comprising a fourth terminal coupled to the third terminal, and a fifth terminal coupled to the voltage input terminal, wherein a capacitance value of the voltage control capacitor corresponds to a voltage difference between a voltage at the fifth terminal and a voltage at the fourth terminal. A better compensation for the amplifier circuit can be acquired since a voltage control capacitor having a capacitance value corresponding to the output voltage of the amplifier is applied.

公开(公告)号：US20180313883A1

公开(公告)日：2018-11-01

申请号：US15798405

申请日：2017-10-31

Applicant: PixArt Imaging Inc.

Inventor： Sung-Han Wu ,  Wooi Kip LIM ,  Kei Tee TIEW ,  KEEN-HUN LEONG

IPC: G01R31/02 ,  G01R31/28 ,  G01D5/24

Abstract: A short circuit testing method for a capacitive sensing device including a plurality of sense lines and a plurality of drive lines includes: under a short circuit testing mode, coupling at least one first line in the sense lines and drive lines to a reference level; using a sensing circuit corresponding to a specific sense line to read out a testing resultant signal; and, comparing the testing resultant signal with a reference signal to determine whether a short circuit exists.