Time-Sequential multi-spectrum imaging device
    1.
    发明授权
    Time-Sequential multi-spectrum imaging device 有权
    时序顺序多光谱成像装置

    公开(公告)号:US08743201B2

    公开(公告)日:2014-06-03

    申请号:US12891465

    申请日:2010-09-27

    CPC classification number: H04N7/18 H04N5/2254 H04N5/332

    Abstract: The present invention discloses a time-sequential multi-spectrum image acquiring device structure which uses a single camera module to achieve multi-spectrum image acquiring in a time-sequential architecture, thereby providing a simple, lightweight telemetry system and reducing the development and operation costs thereof. For example, a visible and near infrared (VNIR) imaging system reduces the use of four camera modules (each including an optical lens, filter, sensor, and image signal processing unit) to single camera module, the VNIR imaging system acquires multi-spectrum images having the same image geometric parameters for image calibration and can simplify the calibration process.The present invention is implemented by introducing a multi-spectrum filter wheel capable of rotating in high speed in the camera module and controlling the image acquiring frequency of the sensor and the synchronicity of the wheel rotating speed for multi-spectrum image acquiring. The present invention is suitable for use in multi-spectrum images acquiring of airborne telemetry requiring lightweight system, such as multi-spectrum images acquiring of unmanned aerial vehicle (UAV).

    Abstract translation: 本发明公开了一种时序多频谱图像获取装置结构,其使用单个相机模块来实现时间顺序结构中的多光谱图像采集,从而提供简单,轻量的遥测系统,并降低开发和运营成本 其中。 例如,可见光和近红外(VNIR)成像系统减少了对单个摄像机模块使用四个摄像机模块(每个包括光学透镜,滤光片,传感器和图像信号处理单元),VNIR成像系统获得多光谱 图像具有用于图像校准的相同图像几何参数,并且可以简化校准过程。 本发明通过引入能够在相机模块中高速旋转的多频谱滤光轮并控制传感器的图像获取频率和用于多光谱图像获取的轮转速度的同步性来实现。 本发明适用于需要轻量化系统的空中遥测的多光谱图像采集,如无人机(UAV)的多光谱图像采集。

    Time-Sequential Multi-Spectrum Imaging Device
    2.
    发明申请
    Time-Sequential Multi-Spectrum Imaging Device 有权
    时间顺序多光谱成像装置

    公开(公告)号:US20120075470A1

    公开(公告)日:2012-03-29

    申请号:US12891465

    申请日:2010-09-27

    CPC classification number: H04N7/18 H04N5/2254 H04N5/332

    Abstract: The present invention discloses a time-sequential multi-spectrum image acquiring device structure which uses a single camera module to achieve multi-spectrum image acquiring in a time-sequential architecture, thereby providing a simple, lightweight telemetry system and reducing the development and operation costs thereof. For example, a visible and near infrared (VNIR) imaging system reduces the use of four camera modules (each including an optical lens, filter, sensor, and image signal processing unit) to single camera module, the VNIR imaging system acquires multi-spectrum images having the same image geometric parameters for image calibration and can simplify the calibration process.The present invention is implemented by introducing a multi-spectrum filter wheel capable of rotating in high speed in the camera module and controlling the image acquiring frequency of the sensor and the synchronicity of the wheel rotating speed for multi-spectrum image acquiring. The present invention is suitable for use in multi-spectrum images acquiring of airborne telemetry requiring lightweight system, such as multi-spectrum images acquiring of unmanned aerial vehicle (UAV).

    Abstract translation: 本发明公开了一种时序多频谱图像获取装置结构,其使用单个相机模块来实现时间顺序结构中的多光谱图像采集,从而提供简单,轻量的遥测系统,并降低开发和运营成本 其中。 例如,可见光和近红外(VNIR)成像系统减少了对单个摄像机模块使用四个摄像机模块(每个包括光学透镜,滤光片,传感器和图像信号处理单元),VNIR成像系统获得多光谱 图像具有用于图像校准的相同图像几何参数,并且可以简化校准过程。 本发明通过引入能够在相机模块中高速旋转的多频谱滤光轮并控制传感器的图像获取频率和用于多光谱图像获取的轮转速度的同步性来实现。 本发明适用于需要轻量化系统的空中遥测的多光谱图像采集,如无人机(UAV)的多光谱图像采集。

    Apparatus and Method for Inspecting Chip Defects
    3.
    发明申请
    Apparatus and Method for Inspecting Chip Defects 审中-公开
    检测芯片缺陷的装置和方法

    公开(公告)号:US20130235186A1

    公开(公告)日:2013-09-12

    申请号:US13416010

    申请日:2012-03-09

    CPC classification number: G06T7/001 G01N21/9515 G06T2207/30148

    Abstract: Disclosed is a chip defect inspection apparatus including a linear array image acquisition module, an illumination control module, a chip defect detection module connected to the LIA module, and an operations and management module connected to the LIA module, the illumination control module and the chip defect detection module.

    Abstract translation: 公开了一种芯片缺陷检查装置,包括线性阵列图像获取模块,照明控制模块,连接到LIA模块的芯片缺陷检测模块,以及连接到LIA模块,照明控制模块和芯片的操作和管理模块 缺陷检测模块。

    IMAGE SEARCHING AND CAPTURING SYSTEM AND CONTROL METHOD THEREOF
    4.
    发明申请
    IMAGE SEARCHING AND CAPTURING SYSTEM AND CONTROL METHOD THEREOF 审中-公开
    图像搜索和捕获系统及其控制方法

    公开(公告)号:US20120307003A1

    公开(公告)日:2012-12-06

    申请号:US13179795

    申请日:2011-07-11

    CPC classification number: H04N5/2251 H04N5/2258 H04N5/2259 H04N5/23238

    Abstract: The present invention discloses an image searching and capturing system and a control method thereof. The system comprises a first capture device, a second capture device, a control module and a processing module. The first capture device captures a plurality of multi-spectral panoramic images with panorama. The control module controls the second capture device to search and target an azimuth of target object according to the plurality of multi-spectral panoramic images; the control module controls that the second capture device rotates a rotation module to capture a high-resolution image of a target object. The control module controls a rotation angle and a rotation direction of the rotation module according to attitude information, position information, and azimuth of the target object. The invention is applied to environmental monitoring and disaster monitoring, and has automatic search for targets, calibration targets and achieve high-resolution images and other effects.

    Abstract translation: 本发明公开了一种图像搜索和捕获系统及其控制方法。 该系统包括第一捕获装置,第二捕获装置,控制模块和处理模块。 第一捕获装置捕获具有全景的多个多光谱全景图像。 所述控制模块根据所述多个多光谱全景图像控制所述第二捕获装置,以搜索和对目标物体的方位; 控制模块控制第二捕获装置旋转旋转模块以捕获目标对象的高分辨率图像。 控制模块根据目标对象的姿态信息,位置信息和方位来控制旋转模块的旋转角度和旋转方向。 本发明适用于环境监测和灾害监测,自动搜索目标,校准目标,实现高分辨率图像等效果。

    System and method for calibrating an ambient light sensor
    5.
    发明授权
    System and method for calibrating an ambient light sensor 失效
    用于校准环境光传感器的系统和方法

    公开(公告)号:US08481917B2

    公开(公告)日:2013-07-09

    申请号:US12612012

    申请日:2009-11-04

    CPC classification number: G01J1/42 G01J1/4204 G01J1/44 G09G2320/062

    Abstract: A system and a method for calibrating an ambient light sensor (ALS) are disclosed. The ALS, an adjustable resistor and a switch are located on a first surface of a printed circuit board (PCB), and the adjustable resistor and the switch are connected in series between an adjustable probe of the ALS and the ground. A resistor is connected between two pads located on a second surface of the PCB via two probes touching the pads. A controller connected to the PCB reads a light sensitivity of the ALS and calculates a calculated resistance value of the adjustable resistor by a formula “detected light sensitivity/resistance value of the resistor=objective light sensitivity/resistance value of the adjustable resistor”, wherein the objective light sensitivity and the resistance value of the resistor are given.

    Abstract translation: 公开了一种用于校准环境光传感器(ALS)的系统和方法。 ALS,可调电阻器和开关位于印刷电路板(PCB)的第一表面上,可调电阻器和开关串联连接在ALS的可调探针和地之间。 电阻器通过两个接触焊盘的探头连接在位于PCB的第二表面上的两个焊盘之间。 连接到PCB的控制器读取ALS的光灵敏度,并通过公式“电阻的检测光敏度/电阻值=可调电阻器的目标光灵敏度/电阻值”来计算可调电阻器的计算电阻值,其中 给出了目标光敏度和电阻值的电阻值。

    Cutting system for master liquid crystal panel having different alignment marks and method for cutting master liquid crystal panel
    6.
    发明申请
    Cutting system for master liquid crystal panel having different alignment marks and method for cutting master liquid crystal panel 审中-公开
    具有不同对准标记的主液晶面板的切割系统和主液晶面板的切割方法

    公开(公告)号:US20080011802A1

    公开(公告)日:2008-01-17

    申请号:US11879240

    申请日:2007-07-16

    Abstract: An exemplary cutting system (1) for a master liquid crystal panel includes a master liquid crystal panel (10) and two charge-coupled devices (12). The master liquid crystal panel includes four corners, and four alignment marks respectively provided at the corners. At least two of the alignment marks at two diagonal corners are different from each other, and the difference are selected from the group consisting of a difference in shape and a difference in distance from a center of the master liquid crystal panel. The charge-coupled devices are positioned adjacent to two adjacent corners of the mother liquid crystal panel at any one time, and are configured to detect and identify the alignment marks at such two adjacent corners. A related method for cutting the master liquid crystal panel is also provided.

    Abstract translation: 用于主液晶面板的示例性切割系统(1)包括主液晶面板(10)和两个电荷耦合器件(12)。 主液晶面板包括分别设置在角部的四个角部和四个对准标记。 两个对角线处的对准标记中的至少两个彼此不同,并且差异选自由主液晶面板的中心的形状差异和距离差异组成的组。 电荷耦合器件在任何时间都与母液晶面板的两个相邻的角相邻地定位,并且被配置为在这两个相邻拐角处检测和识别对准标记。 还提供了用于切割主液晶面板的相关方法。

    Method of Inspecting Chip Defects
    7.
    发明申请
    Method of Inspecting Chip Defects 有权
    检查芯片缺陷的方法

    公开(公告)号:US20130236086A1

    公开(公告)日:2013-09-12

    申请号:US13416041

    申请日:2012-03-09

    CPC classification number: G06T7/0006 G06T2207/20068 G06T2207/30148

    Abstract: The present invention provides a method for inspecting chip defects. A raw image of a chip is used to extract a chip image. A binary chip edge image obtained from the chip image is used for inspecting defects, coordinated with statistics of edge pixels. During packaging the chip, defects that exceed inspection criteria and affect chip quality are quantitatively and accurately inspected out. The present invention has a simple procedure with high performance on inspecting defect modes and defect sizes. Thus, the present invention greatly improves performance and accuracy of inspections on chip defects for further saving a great amount of labor, time and cost.

    Abstract translation: 本发明提供了一种检查芯片缺陷的方法。 使用芯片的原始图像来提取芯片图像。 使用从芯片图像获得的二进制码片边缘图像来检查与边缘像素的统计相协调的缺陷。 在封装芯片期间,可以定量,准确地检查超出检测标准和影响芯片质量的缺陷。 本发明具有在检查缺陷模式和缺陷尺寸方面具有高性能的简单过程。 因此,本发明大大提高了芯片缺陷检查的性能和准确性,进一步节省了大量的劳动力,时间和成本。

    Method of inspecting chip defects
    8.
    发明授权
    Method of inspecting chip defects 有权
    检查芯片缺陷的方法

    公开(公告)号:US08559698B2

    公开(公告)日:2013-10-15

    申请号:US13416041

    申请日:2012-03-09

    CPC classification number: G06T7/0006 G06T2207/20068 G06T2207/30148

    Abstract: The present invention provides a method for inspecting chip defects. A raw image of a chip is used to extract a chip image. A binary chip edge image obtained from the chip image is used for inspecting defects, coordinated with statistics of edge pixels. During packaging the chip, defects that exceed inspection criteria and affect chip quality are quantitatively and accurately inspected out. The present invention has a simple procedure with high performance on inspecting defect modes and defect sizes. Thus, the present invention greatly improves performance and accuracy of inspections on chip defects for further saving a great amount of labor, time and cost.

    Abstract translation: 本发明提供了一种检查芯片缺陷的方法。 使用芯片的原始图像来提取芯片图像。 使用从芯片图像获得的二进制码片边缘图像来检查与边缘像素的统计相协调的缺陷。 在封装芯片期间,可以定量,准确地检查超出检测标准和影响芯片质量的缺陷。 本发明具有在检查缺陷模式和缺陷尺寸方面具有高性能的简单过程。 因此,本发明大大提高了芯片缺陷检查的性能和准确性,进一步节省了大量的劳动力,时间和成本。

    MEDICINE REMINDER DEVICE
    9.
    发明申请
    MEDICINE REMINDER DEVICE 审中-公开
    医疗提醒装置

    公开(公告)号:US20120113761A1

    公开(公告)日:2012-05-10

    申请号:US12941476

    申请日:2010-11-08

    Abstract: A medicine reminder device includes a housing, a processing unit, a schedule-setting input unit, a timing unit, light emitting units and medicine containing units. The schedule-setting input unit, the timing unit and the light emitting units are coupled to the processing unit. Each of the medicine containing units corresponds to at least one of the light emitting units, such that at least a part of light, emitted from the light emitting unit, enters the medicine containing unit and then transmits to the outside. The processing unit receives a schedule-setting event through the schedule-setting input unit to obtain timing information. The timing unit receives the timing information and executes a timing event. The processing unit outputs a control signal according to a result resulting from execution of the timing unit, and enables at least one of the light emitting units according to the control signal.

    Abstract translation: 药物提醒装置包括壳体,处理单元,计划设定输入单元,定时单元,发光单元和药物容纳单元。 调度设置输入单元,定时单元和发光单元耦合到处理单元。 每个药物容纳单元对应于至少一个发光单元,使得从发光单元发射的至少一部分光进入药物容纳单元,然后传输到外部。 处理单元通过调度设置输入单元接收调度设置事件以获得定时信息。 定时单元接收定时信息并执行定时事件。 处理单元根据由定时单元的执行产生的结果来输出控制信号,并根据控制信号启用至少一个发光单元。

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