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公开(公告)号：US08743201B2
公开(公告)日：2014-06-03
申请号：US12891465
申请日：2010-09-27
Applicant: Po-Hsuan Huang , Ming-Fu Chen
Inventor： Po-Hsuan Huang , Ming-Fu Chen
CPC classification number: H04N7/18 , H04N5/2254 , H04N5/332
Abstract: The present invention discloses a time-sequential multi-spectrum image acquiring device structure which uses a single camera module to achieve multi-spectrum image acquiring in a time-sequential architecture, thereby providing a simple, lightweight telemetry system and reducing the development and operation costs thereof. For example, a visible and near infrared (VNIR) imaging system reduces the use of four camera modules (each including an optical lens, filter, sensor, and image signal processing unit) to single camera module, the VNIR imaging system acquires multi-spectrum images having the same image geometric parameters for image calibration and can simplify the calibration process.The present invention is implemented by introducing a multi-spectrum filter wheel capable of rotating in high speed in the camera module and controlling the image acquiring frequency of the sensor and the synchronicity of the wheel rotating speed for multi-spectrum image acquiring. The present invention is suitable for use in multi-spectrum images acquiring of airborne telemetry requiring lightweight system, such as multi-spectrum images acquiring of unmanned aerial vehicle (UAV).
Abstract translation: 本发明公开了一种时序多频谱图像获取装置结构，其使用单个相机模块来实现时间顺序结构中的多光谱图像采集，从而提供简单，轻量的遥测系统，并降低开发和运营成本 其中。 例如，可见光和近红外（VNIR）成像系统减少了对单个摄像机模块使用四个摄像机模块（每个包括光学透镜，滤光片，传感器和图像信号处理单元），VNIR成像系统获得多光谱 图像具有用于图像校准的相同图像几何参数，并且可以简化校准过程。 本发明通过引入能够在相机模块中高速旋转的多频谱滤光轮并控制传感器的图像获取频率和用于多光谱图像获取的轮转速度的同步性来实现。 本发明适用于需要轻量化系统的空中遥测的多光谱图像采集，如无人机（UAV）的多光谱图像采集。
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公开(公告)号：US08481917B2
公开(公告)日：2013-07-09
申请号：US12612012
申请日：2009-11-04
Applicant: Li-Mei Chen , Ming-Fu Chen , Yi-Hsun Lin
Inventor： Li-Mei Chen , Ming-Fu Chen , Yi-Hsun Lin
CPC classification number: G01J1/42 , G01J1/4204 , G01J1/44 , G09G2320/062
Abstract: A system and a method for calibrating an ambient light sensor (ALS) are disclosed. The ALS, an adjustable resistor and a switch are located on a first surface of a printed circuit board (PCB), and the adjustable resistor and the switch are connected in series between an adjustable probe of the ALS and the ground. A resistor is connected between two pads located on a second surface of the PCB via two probes touching the pads. A controller connected to the PCB reads a light sensitivity of the ALS and calculates a calculated resistance value of the adjustable resistor by a formula “detected light sensitivity/resistance value of the resistor=objective light sensitivity/resistance value of the adjustable resistor”, wherein the objective light sensitivity and the resistance value of the resistor are given.
Abstract translation: 公开了一种用于校准环境光传感器（ALS）的系统和方法。 ALS，可调电阻器和开关位于印刷电路板（PCB）的第一表面上，可调电阻器和开关串联连接在ALS的可调探针和地之间。 电阻器通过两个接触焊盘的探头连接在位于PCB的第二表面上的两个焊盘之间。 连接到PCB的控制器读取ALS的光灵敏度，并通过公式“电阻的检测光敏度/电阻值=可调电阻器的目标光灵敏度/电阻值”来计算可调电阻器的计算电阻值，其中 给出了目标光敏度和电阻值的电阻值。
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公开(公告)号：US20130236086A1
公开(公告)日：2013-09-12
申请号：US13416041
申请日：2012-03-09
Applicant: Ming-Fu Chen , Chun-Chao Chang
Inventor： Ming-Fu Chen , Chun-Chao Chang
IPC: G06K9/48
CPC classification number: G06T7/0006 , G06T2207/20068 , G06T2207/30148
Abstract: The present invention provides a method for inspecting chip defects. A raw image of a chip is used to extract a chip image. A binary chip edge image obtained from the chip image is used for inspecting defects, coordinated with statistics of edge pixels. During packaging the chip, defects that exceed inspection criteria and affect chip quality are quantitatively and accurately inspected out. The present invention has a simple procedure with high performance on inspecting defect modes and defect sizes. Thus, the present invention greatly improves performance and accuracy of inspections on chip defects for further saving a great amount of labor, time and cost.
Abstract translation: 本发明提供了一种检查芯片缺陷的方法。 使用芯片的原始图像来提取芯片图像。 使用从芯片图像获得的二进制码片边缘图像来检查与边缘像素的统计相协调的缺陷。 在封装芯片期间，可以定量，准确地检查超出检测标准和影响芯片质量的缺陷。 本发明具有在检查缺陷模式和缺陷尺寸方面具有高性能的简单过程。 因此，本发明大大提高了芯片缺陷检查的性能和准确性，进一步节省了大量的劳动力，时间和成本。
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公开(公告)号：US20120075470A1
公开(公告)日：2012-03-29
申请号：US12891465
申请日：2010-09-27
Applicant: Po-Hsuan Huang , Ming-Fu Chen
Inventor： Po-Hsuan Huang , Ming-Fu Chen
IPC: H04N7/18
CPC classification number: H04N7/18 , H04N5/2254 , H04N5/332
Abstract: The present invention discloses a time-sequential multi-spectrum image acquiring device structure which uses a single camera module to achieve multi-spectrum image acquiring in a time-sequential architecture, thereby providing a simple, lightweight telemetry system and reducing the development and operation costs thereof. For example, a visible and near infrared (VNIR) imaging system reduces the use of four camera modules (each including an optical lens, filter, sensor, and image signal processing unit) to single camera module, the VNIR imaging system acquires multi-spectrum images having the same image geometric parameters for image calibration and can simplify the calibration process.The present invention is implemented by introducing a multi-spectrum filter wheel capable of rotating in high speed in the camera module and controlling the image acquiring frequency of the sensor and the synchronicity of the wheel rotating speed for multi-spectrum image acquiring. The present invention is suitable for use in multi-spectrum images acquiring of airborne telemetry requiring lightweight system, such as multi-spectrum images acquiring of unmanned aerial vehicle (UAV).
Abstract translation: 本发明公开了一种时序多频谱图像获取装置结构，其使用单个相机模块来实现时间顺序结构中的多光谱图像采集，从而提供简单，轻量的遥测系统，并降低开发和运营成本 其中。 例如，可见光和近红外（VNIR）成像系统减少了对单个摄像机模块使用四个摄像机模块（每个包括光学透镜，滤光片，传感器和图像信号处理单元），VNIR成像系统获得多光谱 图像具有用于图像校准的相同图像几何参数，并且可以简化校准过程。 本发明通过引入能够在相机模块中高速旋转的多频谱滤光轮并控制传感器的图像获取频率和用于多光谱图像获取的轮转速度的同步性来实现。 本发明适用于需要轻量化系统的空中遥测的多光谱图像采集，如无人机（UAV）的多光谱图像采集。
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公开(公告)号：US20200221944A1
公开(公告)日：2020-07-16
申请号：US16831445
申请日：2020-03-26
Applicant: Ho-Fang SHEN , Ming-Fu CHEN
Inventor： Ho-Fang SHEN , Ming-Fu CHEN
Abstract: A virtual reality-based ophthalmic inspection system includes a wearable unit, an electronic unit, and at least one detector. The wearable unit is available for an inspected object to wear the wearable unit on head. The electronic unit is assembled with the wearable unit and has a left-eye display zone and a right-eye display zone. A first visual acuity of the inspected object is identified according to a first eyesight information. The electronic unit performs a visual correction confirmation process, the at least one detector detects a condition value of corresponding the right eye and/or the left eye, and the electronic unit answers a first comparison result after comparing the condition value with a threshold value.
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Patent Agency Ranking
公开(公告)号：US20180344148A1
公开(公告)日：2018-12-06
申请号：US16000668
申请日：2018-06-05
Applicant: Ho-Fang SHEN , Ming-Fu CHEN
Inventor： Ho-Fang SHEN , Ming-Fu CHEN
Abstract: A virtual reality-based ophthalmic inspection system includes a wearable unit, an electronic unit, and at least one detector; the wearable unit is available for an inspected object to wear the wearable unit on head; the electronic unit is assembled with the wearable unit and has a left-eye display zone and a right-eye display zone, wherein the left-eye display zone is used for displaying at least one left-eye sight-targets, and the right-eye display zone is used for displaying at least one right-eye sight-targets; the detector is disposed on the electronic unit. A sight-target with at least one distinguishing feature are shown on one of the left-eye display zone and the right-eye display zone, the left-eye display zone displays the sight-target while the right-eye display zone is filled with black, and the right-eye display zone displays the sight-target while the left-eye display zone is filled with black.
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公开(公告)号：US20120116770A1
公开(公告)日：2012-05-10
申请号：US12941524
申请日：2010-11-08
Applicant: Ming-Fu CHEN , Cheng-Hsiung Chen , Daow-Ming Jiang , Chan-Fa Chiu , Cheng-Jen Lin , Po-Yiu Liu
Inventor： Ming-Fu CHEN , Cheng-Hsiung Chen , Daow-Ming Jiang , Chan-Fa Chiu , Cheng-Jen Lin , Po-Yiu Liu
CPC classification number: H04M3/4938
Abstract: A speech data retrieving and presenting device applied with an electronic device through a network includes a data receiving unit, a processing unit and a speech presenting unit. The data receiving unit connected to the network receives data of the electronic device through the network. The processing unit coupled to the data receiving unit receives speech data and retrieves a speech presenting signal from the speech data. The speech presenting unit coupled to the processing unit receives the speech presenting signal and outputs a speech according to the speech data. This device can assist a user to obtain network information, and provide the user a more flexible application according to the property that the device can be operated independently by a simple motion.
Abstract translation: 通过网络应用电子设备的语音数据检索和呈现装置包括数据接收单元，处理单元和语音呈现单元。 连接到网络的数据接收单元通过网络接收电子设备的数据。 耦合到数据接收单元的处理单元接收语音数据并从语音数据中检索语音呈现信号。 耦合到处理单元的语音呈现单元接收语音呈现信号，并根据语音数据输出语音。 该设备可以帮助用户获得网络信息，并且根据可以通过简单的运动独立地操作设备的属性向用户提供更灵活的应用。
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8.发明申请Cutting system for master liquid crystal panel having different alignment marks and method for cutting master liquid crystal panel 审中-公开具有不同对准标记的主液晶面板的切割系统和主液晶面板的切割方法公开(公告)号：US20080011802A1
公开(公告)日：2008-01-17
申请号：US11879240
申请日：2007-07-16
Applicant: Ming-Fu Chen , Wen-Kai Chung , Cheng-Doul Chuang , Shih-Yao Lin , Hung-Wen Yang
Inventor： Ming-Fu Chen , Wen-Kai Chung , Cheng-Doul Chuang , Shih-Yao Lin , Hung-Wen Yang
IPC: B26F3/00
CPC classification number: B26D7/01 , C03B33/037 , G02F1/1303 , G02F1/133351 , Y10T225/12 , Y10T225/325
Abstract: An exemplary cutting system (1) for a master liquid crystal panel includes a master liquid crystal panel (10) and two charge-coupled devices (12). The master liquid crystal panel includes four corners, and four alignment marks respectively provided at the corners. At least two of the alignment marks at two diagonal corners are different from each other, and the difference are selected from the group consisting of a difference in shape and a difference in distance from a center of the master liquid crystal panel. The charge-coupled devices are positioned adjacent to two adjacent corners of the mother liquid crystal panel at any one time, and are configured to detect and identify the alignment marks at such two adjacent corners. A related method for cutting the master liquid crystal panel is also provided.
Abstract translation: 用于主液晶面板的示例性切割系统（1）包括主液晶面板（10）和两个电荷耦合器件（12）。 主液晶面板包括分别设置在角部的四个角部和四个对准标记。 两个对角线处的对准标记中的至少两个彼此不同，并且差异选自由主液晶面板的中心的形状差异和距离差异组成的组。 电荷耦合器件在任何时间都与母液晶面板的两个相邻的角相邻地定位，并且被配置为在这两个相邻拐角处检测和识别对准标记。 还提供了用于切割主液晶面板的相关方法。
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公开(公告)号：US08559698B2
公开(公告)日：2013-10-15
申请号：US13416041
申请日：2012-03-09
Applicant: Ming-Fu Chen , Chun-Chao Chang
Inventor： Ming-Fu Chen , Chun-Chao Chang
CPC classification number: G06T7/0006 , G06T2207/20068 , G06T2207/30148
Abstract: The present invention provides a method for inspecting chip defects. A raw image of a chip is used to extract a chip image. A binary chip edge image obtained from the chip image is used for inspecting defects, coordinated with statistics of edge pixels. During packaging the chip, defects that exceed inspection criteria and affect chip quality are quantitatively and accurately inspected out. The present invention has a simple procedure with high performance on inspecting defect modes and defect sizes. Thus, the present invention greatly improves performance and accuracy of inspections on chip defects for further saving a great amount of labor, time and cost.
Abstract translation: 本发明提供了一种检查芯片缺陷的方法。 使用芯片的原始图像来提取芯片图像。 使用从芯片图像获得的二进制码片边缘图像来检查与边缘像素的统计相协调的缺陷。 在封装芯片期间，可以定量，准确地检查超出检测标准和影响芯片质量的缺陷。 本发明具有在检查缺陷模式和缺陷尺寸方面具有高性能的简单过程。 因此，本发明大大提高了芯片缺陷检查的性能和准确性，进一步节省了大量的劳动力，时间和成本。
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公开(公告)号：US20130235186A1
公开(公告)日：2013-09-12
申请号：US13416010
申请日：2012-03-09
Applicant: Ming-Fu Chen , Po-Hsuan Huang , Yung-Hsiang Chen
Inventor： Ming-Fu Chen , Po-Hsuan Huang , Yung-Hsiang Chen
CPC classification number: G06T7/001 , G01N21/9515 , G06T2207/30148
Abstract: Disclosed is a chip defect inspection apparatus including a linear array image acquisition module, an illumination control module, a chip defect detection module connected to the LIA module, and an operations and management module connected to the LIA module, the illumination control module and the chip defect detection module.
Abstract translation: 公开了一种芯片缺陷检查装置，包括线性阵列图像获取模块，照明控制模块，连接到LIA模块的芯片缺陷检测模块，以及连接到LIA模块，照明控制模块和芯片的操作和管理模块 缺陷检测模块。
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