公开(公告)号：US20110299332A1

公开(公告)日：2011-12-08

申请号：US13209500

申请日：2011-08-15

Applicant: Pyung-Moon ZHANG ,  Jin-Yub LEE

Inventor： Pyung-Moon ZHANG ,  Jin-Yub LEE

IPC: G11C16/10

CPC classification number: G01R31/3004 ,  G11C29/02 ,  G11C29/021 ,  G11C29/1201 ,  G11C29/48 ,  G11C29/56

Abstract: Provided are a test system and a related high voltage measurement method. The method includes applying an external voltage signal to one or more of a plurality of DUTs via the shared channel, comparing the external voltage signal with a high voltage signal internally generated by the one or more DUTs and generating a corresponding comparison result, and determining a voltage level for each respective high voltage signal in accordance with the comparison result.

Abstract translation: 提供了一种测试系统和相关的高电压测量方法。 该方法包括：经由共享信道将外部电压信号施加到多个DUT中的一个或多个，将外部电压信号与由一个或多个DUT内部产生的高电压信号进行比较并产生相应的比较结果， 根据比较结果对各高压信号进行电压电平。

公开(公告)号：US20090077423A1

公开(公告)日：2009-03-19

申请号：US12208565

申请日：2008-09-11

Applicant: Chang-Rae KIM ,  Pyung-Moon ZHANG

Inventor： Chang-Rae KIM ,  Pyung-Moon ZHANG

IPC: G06F11/14 ,  G06F12/02

CPC classification number: G06F11/1417 ,  G06F11/1004 ,  G06F11/2284

Abstract: Provided are a semiconductor memory device, memory system and method of executing a bootloading operation. The method includes cyclically executing a bootloading operation cycle that includes loading the boot information from the memory to the controller, and performing an ECC operation on the boot information. The ECC operation provides a fail condition indication or a pass condition indication and if the fail condition indication is provided, the next bootloading operation cycle is executed.

Abstract translation: 提供了一种半导体存储器件，存储器系统和执行引导加载操作的方法。 该方法包括循环地执行引导操作循环，其包括将来自存储器的引导信息加载到控制器，以及对引导信息执行ECC操作。 ECC操作提供故障状态指示或通过条件指示，并且如果提供了故障状态指示，则执行下一个引导加载操作循环。