LEAKAGE COMPENSATION CIRCUIT FOR PHASE-LOCKED LOOP (PLL) LARGE THIN OXIDE CAPACITORS
    1.
    发明申请
    LEAKAGE COMPENSATION CIRCUIT FOR PHASE-LOCKED LOOP (PLL) LARGE THIN OXIDE CAPACITORS 审中-公开
    用于相位锁定环路(PLL)的大型氧化物电容器的泄漏补偿电路

    公开(公告)号:US20160373116A1

    公开(公告)日:2016-12-22

    申请号:US15257578

    申请日:2016-09-06

    CPC classification number: H03L7/0802 H02M3/07 H03L7/0891 H03L7/093

    Abstract: Certain aspects of the present disclosure provide methods and apparatus for compensating, or at least adjusting, for capacitor leakage. One example method generally includes determining a leakage voltage corresponding to a leakage current of a capacitor in a filter for a phase-locked loop (PLL), wherein the determining comprises closing a set of switches for discontinuous sampling of the leakage voltage; based on the sampled leakage voltage, generating a sourced current approximately equal to the leakage current; and injecting the sourced current into the capacitor.

    Abstract translation: 本公开的某些方面提供了用于补偿或至少调整电容器泄漏的方法和装置。 一个示例性方法通常包括确定对应于用于锁相环(PLL)的滤波器中的电容器的漏电流的泄漏电压,其中所述确定包括闭合一组开关以不连续地采样泄漏电压; 基于采样的泄漏电压,产生大致等于泄漏电流的源电流; 并将源电流注入电容器。

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