公开(公告)号：US10132861B2

公开(公告)日：2018-11-20

申请号：US15268463

申请日：2016-09-16

Applicant: QUALCOMM Incorporated

Inventor： Rama Rao Goruganthu ,  Gaurav Sunil Mattey ,  Martin Villafana

IPC: G01R31/308 ,  G01R31/311 ,  G01R1/07 ,  G01R31/28

Abstract: A transparent coversheet intervenes between a lens and a thinned die in a visible light fault analysis tool so that the thinned die is robust to fractures. In addition, the transparent coversheet has a greater thermal mass than the thinned die and thus acts as a heat sink to prevent active circuitry in the thinned die from overheating during the visible light fault analysis.

公开(公告)号：US20160116531A1

公开(公告)日：2016-04-28

申请号：US14525539

申请日：2014-10-28

Applicant: QUALCOMM Incorporated

Inventor： Lavakumar Ranganathan ,  Martin Villafana ,  Lesly Zaren Venturina Endrinal

IPC: G01R31/311 ,  G01R31/28

CPC classification number: G01R31/311 ,  G01R31/2834 ,  G01R31/2837

Abstract: A method and apparatus for mapping an electronic device. The electronic device is loaded into a test fixture, which may be an automated test equipment (ATE). A laser beam is stepped across locations of interest. At each location of interest a minimum voltage and/or maximum frequency are computed. A contour map of the changes in minimum voltage and maximum frequency across a field of view of the electronic device is generated. Additional embodiments provide signaling a laser scan module during the rising edge of a synchronization pulse to indicate that minimum voltage (Vmin) and maximum frequency (Fmax) specification search data is provided to a laser voltage probe. A Vmin/Fmax module compares the specification search data with the data read from the laser voltage probe and computes a parameter shift value. The laser beam is moved to another location when the falling edge of the synchronization pulse occurs.

Abstract translation: 一种用于映射电子设备的方法和装置。 电子设备被装载到测试夹具中，其可以是自动测试设备（ATE）。 激光束跨越感兴趣的位置。 在感兴趣的每个位置，计算最小电压和/或最大频率。 产生电子设备的视野中的最小电压和最大频率的变化的等高线图。 另外的实施例提供在同步脉冲的上升沿期间向激光扫描模块发信号，以指示将最小电压（Vmin）和最大频率（Fmax）指定搜索数据提供给激光电压探针。 Vmin / Fmax模块将规格搜索数据与从激光电压探头读取的数据进行比较，并计算参数移位值。 当发生同步脉冲的下降沿时，激光束被移动到另一个位置。

公开(公告)号：US09599666B2

公开(公告)日：2017-03-21

申请号：US14525539

申请日：2014-10-28

Applicant: QUALCOMM Incorporated

Inventor： Lavakumar Ranganathan ,  Martin Villafana ,  Lesly Zaren Venturina Endrinal

IPC: G01R31/308 ,  G01R31/311 ,  G01R31/28

CPC classification number: G01R31/311 ,  G01R31/2834 ,  G01R31/2837

Abstract: A method and apparatus for mapping an electronic device. The electronic device is loaded into a test fixture, which may be an automated test equipment (ATE). A laser beam is stepped across locations of interest. At each location of interest a minimum voltage and/or maximum frequency are computed. A contour map of the changes in minimum voltage and maximum frequency across a field of view of the electronic device is generated. Additional embodiments provide signaling a laser scan module during the rising edge of a synchronization pulse to indicate that minimum voltage (Vmin) and maximum frequency (Fmax) specification search data is provided to a laser voltage probe. A Vmin/Fmax module compares the specification search data with the data read from the laser voltage probe and computes a parameter shift value. The laser beam is moved to another location when the falling edge of the synchronization pulse occurs.

公开(公告)号：US20180080983A1

公开(公告)日：2018-03-22

申请号：US15268463

申请日：2016-09-16

Applicant: QUALCOMM Incorporated

Inventor： Rama Rao Goruganthu ,  Gaurav Sunil Mattey ,  Martin Villafana

IPC: G01R31/311 ,  G01R31/28 ,  G01R1/07

CPC classification number: G01R31/311 ,  G01R1/071 ,  G01R31/2834

Abstract: A transparent coversheet intervenes between a lens and a thinned die in a visible light fault analysis tool so that the thinned die is robust to fractures. In addition, the transparent coversheet has a greater thermal mass than the thinned die and thus acts as a heat sink to prevent active circuitry in the thinned die from overheating during the visible light fault analysis.