Scene layout estimation
    1.
    发明授权

    公开(公告)号:US11797724B2

    公开(公告)日:2023-10-24

    申请号:US17454020

    申请日:2021-11-08

    Abstract: Systems and techniques are provided for determining environmental layouts. For example, based on one or more images of an environment and depth information associated with the one or more images, a set of candidate layouts and a set of candidate objects corresponding to the environment can be detected. The set of candidate layouts and set of candidate objects can be organized as a structured tree. For instance, a structured tree can be generated including nodes corresponding to the set of candidate layouts and the set of candidate objects. A combination of objects and layouts can be selected in the structured tree (e.g., based on a search of the structured tree, such as using a Monte-Carlo Tree Search (MCTS) algorithm or adapted MCTS algorithm). A three-dimensional (3D) layout of the environment can be determined based on the combination of objects and layouts in the structured tree.

    Model retrieval for objects in images using field descriptors

    公开(公告)号:US11361505B2

    公开(公告)日:2022-06-14

    申请号:US16655174

    申请日:2019-10-16

    Abstract: Techniques are provided for one or more three-dimensional models representing one or more objects. For example, an input image including one or more objects can be obtained. From the input image, a location field can be generated for each object of the one or more objects. A location field descriptor can be determined for each object of the one or more objects, and a location field descriptor for an object of the one or more objects can be compared to a plurality of location field descriptors for a plurality of three-dimensional models. A three-dimensional model can be selected from the plurality of three-dimensional models for each object of the one or more objects. A three-dimensional model can be selected for the object based on comparing a location field descriptor for the object to the plurality of location field descriptors for the plurality of three-dimensional models.

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