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1.
公开(公告)号:US20120070991A1
公开(公告)日:2012-03-22
申请号:US13305479
申请日:2011-11-28
申请人: RAJIV K. SINGH , ARUL Chakkaravarthi ARJUNAN , DIBAKAR DAS , DEEPIKA SINGH , ABHUDAYA MISHRA , TANJORE V. JAYARAMAN
发明人: RAJIV K. SINGH , ARUL Chakkaravarthi ARJUNAN , DIBAKAR DAS , DEEPIKA SINGH , ABHUDAYA MISHRA , TANJORE V. JAYARAMAN
IPC分类号: H01L21/306
CPC分类号: H01L21/31053 , C09G1/02 , C09K3/1463 , C23F1/14 , H01L21/02024 , H01L21/0475 , H01L21/30625
摘要: Slurry compositions and chemically activated CMP methods for polishing a substrate having a silicon carbide surface using such slurries. In such methods, the silicon carbide surface is contacted with a CMP slurry composition that comprises i) a liquid carrier and ii) a plurality of particles having at least a soft surface portion, wherein the soft surface portion includes a transition metal compound that provides a Mohs hardness ≦6, and optionally iii) an oxidizing agent. The oxidizing agent can include a transition metal. The slurry is moved relative to the silicon carbide comprising surface, wherein at least a portion of the silicon carbide surface is removed.
摘要翻译: 用于使用这种浆料抛光具有碳化硅表面的基材的浆料组合物和化学活化的CMP方法。 在这种方法中,碳化硅表面与CMP浆料组合物接触,CMP浆料组合物包括i)液体载体和ii)至少具有软表面部分的多个颗粒,其中软表面部分包括过渡金属化合物,其提供 莫氏硬度n1E; 6,任选地iii)氧化剂。 氧化剂可以包括过渡金属。 浆料相对于包含碳化硅的表面移动,其中去除至少一部分碳化硅表面。
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2.
公开(公告)号:US20100258528A1
公开(公告)日:2010-10-14
申请号:US12422771
申请日:2009-04-13
申请人: RAJIV K. SINGH , ARUL CHAKKARAVARTHI ARJUNAN , DIBAKAR DAS , DEEPIKA SINGH , ABHUDAYA MISHRA , TANJORE V. JAYARAMAN
发明人: RAJIV K. SINGH , ARUL CHAKKARAVARTHI ARJUNAN , DIBAKAR DAS , DEEPIKA SINGH , ABHUDAYA MISHRA , TANJORE V. JAYARAMAN
CPC分类号: H01L21/31053 , C09G1/02 , C09K3/1463 , C23F1/14 , H01L21/02024 , H01L21/0475 , H01L21/30625
摘要: Slurry compositions and chemically activated CMP methods for polishing a substrate having a silicon carbide surface using such slurries. In such methods, the silicon carbide surface is contacted with a CMP slurry composition that comprises i) a liquid carrier and ii) a plurality of particles having at least a soft surface portion, wherein the soft surface portion includes a transition metal compound that provides a Mohs hardness ≦6, and optionally iii) an oxidizing agent. The oxidizing agent can include a transition metal. The slurry is moved relative to the silicon carbide comprising surface, wherein at least a portion of eth silicon carbide surface is removed.
摘要翻译: 用于使用这种浆料抛光具有碳化硅表面的基材的浆料组合物和化学活化的CMP方法。 在这种方法中,碳化硅表面与CMP浆料组合物接触,CMP浆料组合物包括i)液体载体和ii)至少具有软表面部分的多个颗粒,其中软表面部分包括过渡金属化合物,其提供 莫氏硬度n1E; 6,任选地iii)氧化剂。 氧化剂可以包括过渡金属。 浆料相对于包含碳化硅的表面移动,其中除去至少一部分的eth碳化硅表面。
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