Technique for fabricating high Q MIM capacitors
    1.
    发明授权
    Technique for fabricating high Q MIM capacitors 失效
    制造高Q MIM电容器的技术

    公开(公告)号:US3894872A

    公开(公告)日:1975-07-15

    申请号:US48945674

    申请日:1974-07-17

    Applicant: RCA CORP

    CPC classification number: H01G4/08 Y10S438/977 Y10T29/435

    Abstract: A process for making an MIM (metal-insulator-metal) capacitor comprising thermally depositing or growing a dielectric on a silicon substrate, depositing an electrode on the dielectric, removing the silicon substrate, thereby exposing the dielectric, and depositing a second electrode on the exposed dielectric is disclosed.

    Abstract translation: 一种用于制造MIM(金属 - 绝缘体 - 金属)电容器的方法,包括在硅衬底上热沉积或生长电介质,在电介质上沉积电极,去除硅衬底,从而暴露电介质,并将第二电极沉积在 公开了电介质。

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