公开(公告)号：US20150097601A1

公开(公告)日：2015-04-09

申请号：US14571211

申请日：2014-12-15

Applicant: RENESAS ELECTRONICS CORPORATION

Inventor： Shigeki NAKAMURA ,  Shintaro MORI ,  Yoshinori TOKIOKA ,  Kenji TOKAMI

IPC: H03K17/22 ,  H03K3/012

CPC classification number: H03K17/223 ,  H03K3/012 ,  H03L5/02

Abstract: To provide a semiconductor device provided with a power-on reset circuit that can reliably detect decrease in power-supply voltage. The power-on reset circuit provided on the semiconductor device includes: a first comparison circuit that compares a primary voltage with a reference value; and a second comparison circuit that compares a secondary voltage with the reference value. The power-on reset circuit issues a reset signal based on comparison results of the first and second comparison circuits.

Abstract translation: 提供一种设置有可以可靠地检测电源电压降低的上电复位电路的半导体器件。 设置在半导体器件上的上电复位电路包括：将初级电压与参考值进行比较的第一比较电路; 以及将次级电压与参考值进行比较的第二比较电路。 基于第一和第二比较电路的比较结果，上电复位电路发出复位信号。

公开(公告)号：US20140084972A1

公开(公告)日：2014-03-27

申请号：US14036763

申请日：2013-09-25

Applicant: RENESAS ELECTRONICS CORPORATION

Inventor： Shigeki NAKAMURA ,  Shintaro MORI ,  Yoshinori TOKIOKA ,  Kenji TOKAMI

IPC: H03L5/02

CPC classification number: H03K17/223 ,  H03K3/012 ,  H03L5/02

Abstract: To provide a semiconductor device provided with a power-on reset circuit that can reliably detect decrease in power-supply voltage. The power-on reset circuit provided on the semiconductor device includes: a first comparison circuit that compares a primary voltage with a reference value; and a second comparison circuit that compares a secondary voltage with the reference value. The power-on reset circuit issues a reset signal based on comparison results of the first and second comparison circuits.

Abstract translation: 提供一种设置有可以可靠地检测电源电压降低的上电复位电路的半导体器件。 设置在半导体器件上的上电复位电路包括：将初级电压与参考值进行比较的第一比较电路; 以及将次级电压与参考值进行比较的第二比较电路。 基于第一和第二比较电路的比较结果，上电复位电路发出复位信号。