公开(公告)号：US20200225171A1

公开(公告)日：2020-07-16

申请号：US16741926

申请日：2020-01-14

Applicant: ROLLS-ROYCE plc

Inventor： Jacqueline GRIFFITHS ,  Scott DUFFERWIEL ,  Narcisa C PINZARIU ,  Carlos Eduardo MESQUITA FRIAS

IPC: G01N23/207 ,  G01N23/20008 ,  G01N29/06

Abstract: A method of detecting an anomaly in a crystallographic structure, the method comprising: illuminating the structure with x-ray radiation in a known direction relative to the crystallographic orientation; positioning the structure such that its crystallographic orientation is known; detecting a pattern of the diffracted x-ray radiation transmitted through the structure; generating the simulated pattern based on the known direction relative to the crystallographic orientation; comparing the detected pattern to a simulated pattern for x-ray radiation illuminating in the known direction; and, detecting the anomaly in the crystallographic structure based on the comparison.

公开(公告)号：US20210025835A1

公开(公告)日：2021-01-28

申请号：US16932939

申请日：2020-07-20

Applicant: ROLLS-ROYCE plc

Inventor： Jacqueline GRIFFITHS ,  Scott DUFFERWIEL ,  Jonathan EYRE

IPC: G01N23/20

Abstract: A method of defining at least one scan parameter for an x-ray scan of a single crystal structure, the method comprising: determining a target orientation of the structure for the scan; and defining different non-zero levels of x-ray exposure for different parts of a scan area based on either or both of the target orientation and characteristics of the structure; and, defining the scan area so that substantially all x-rays of the scan are directed to the structure in the target orientation.