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1.发明授权Process parameter based I/O timing programmability using electrical fuse elements 有权使用电熔丝元件的基于工艺参数的I / O定时可编程性公开(公告)号：US07277808B1
公开(公告)日：2007-10-02
申请号：US11381425
申请日：2006-05-03
申请人： Raguram Damodaran , Manjeri Krishnan , Todd Beck
发明人： Raguram Damodaran , Manjeri Krishnan , Todd Beck
IPC分类号： G06F19/00
CPC分类号： G06F17/5045 , G06F2217/62 , G06F2217/84
摘要： Electrical fuses (eFuses) are applied to the task of achieving very tightly controlled Input-Output (I/O) timing specifications. The I/O timing is made programmable and subject to adjustment as part of wafer probe testing. The techniques of parametric adjustment presented are based upon what is commonly referred to as clock skewing or clock tuning. The invention describes methods to select the clock skewing on a die-to-die basis based on functional testing with the actual parametric limits imposed on parameters of interest. The results associated with each die form the basis for hard-programming the selected clock skew value into the die via electrical fuses.
摘要翻译： 电气保险丝（eFuses）适用于实现非常严格控制的输入输出（I / O）时序规范的任务。 I / O定时可编程，可作为晶圆探针测试的一部分进行调整。 所提出的参数调整技术是基于通常称为时钟偏移或时钟调谐的。 本发明描述了基于功能测试来选择基于管芯到管芯的时钟偏移的方法，该功能测试具有施加在感兴趣的参数上的实际参数限制。 与每个芯片相关的结果构成了通过电熔丝将所选择的时钟偏移值硬编程到芯片中的基础。
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2.发明申请Process parameter based I/O timing programmability using electrical fuse elements 有权使用电熔丝元件的基于工艺参数的I / O定时可编程性公开(公告)号：US20050075830A1
公开(公告)日：2005-04-07
申请号：US10679724
申请日：2003-10-06
申请人： Raguram Damodaran , Manjeri Krishnan , Todd Beck
发明人： Raguram Damodaran , Manjeri Krishnan , Todd Beck
IPC分类号： G01R31/317 , G04G15/00 , G06F15/00 , H01L21/82 , H01L21/822 , H01L27/04
CPC分类号： G01R31/31725 , G01R31/31726
摘要： Electrical fuses (eFuses) are applied to the task of achieving very tightly controlled Input-Output (I/O) timing specifications. The I/O timing is made programmable and subject to adjustment as part of wafer probe testing. The techniques of parametric adjustment presented are based upon what is commonly referred to as clock skewing or clock tuning. The invention describes methods to select the clock skewing on a die-to-die basis based on functional testing with the actual parametric limits imposed on parameters of interest. The results associated with each die form the basis for hard-programming the selected clock skew value into the die via electrical fuses.
摘要翻译： 电气保险丝（eFuses）适用于实现非常严格控制的输入输出（I / O）时序规范的任务。 I / O定时可编程，可作为晶圆探针测试的一部分进行调整。 所提出的参数调整技术是基于通常称为时钟偏移或时钟调谐的。 本发明描述了基于功能测试来选择基于管芯到管芯的时钟偏移的方法，该功能测试具有施加在感兴趣的参数上的实际参数限制。 与每个芯片相关的结果构成了通过电熔丝将所选择的时钟偏移值硬编程到芯片中的基础。
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公开(公告)号：US07158902B2
公开(公告)日：2007-01-02
申请号：US10679724
申请日：2003-10-06
申请人： Raguram Damodaran , Manjeri Krishnan , Todd Beck
发明人： Raguram Damodaran , Manjeri Krishnan , Todd Beck
IPC分类号： G06F19/00
CPC分类号： G01R31/31725 , G01R31/31726
摘要： Electrical fuses (eFuses) are applied to the task of achieving very tightly controlled Input-Output (I/O) timing specifications. The I/O timing is made programmable and subject to adjustment as part of wafer probe testing. The techniques of parametric adjustment presented are based upon what is commonly referred to as clock skewing or clock tuning. The invention describes methods to select the clock skewing on a die-to-die basis based on functional testing with the actual parametric limits imposed on parameters of interest. The results associated with each die form the basis for hard-programming the selected clock skew value into the die via electrical fuses.
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公开(公告)号：US06928011B2
公开(公告)日：2005-08-09
申请号：US10630963
申请日：2003-07-30
CPC分类号： G11C29/027 , G11C29/028 , G11C29/50 , G11C29/50012
摘要： Electrical fuses (eFuses) are applied to the task of memory performance adjustment to improve upon earlier fuse techniques by not requiring an additional processing step and expensive equipment. Standard electrical fuse (eFuse) hardware chains provide a soft test feature wherein the effect of memory slow-down can be tested prior to actually programming the fuses. Electrical fuses thus provide a very efficient non-volatile method to match the logic-memory interface through memory trimming, drastically cutting costs and cycle times involved.
摘要翻译： 电气保险丝（eFuse）被应用于存储器性能调整的任务，以通过不需要额外的处理步骤和昂贵的设备来改进早期保险丝技术。 标准电熔丝（eFuse）硬件链提供了软测试功能，其中可以在实际编程保险丝之前测试存储器减速的影响。 因此，电熔丝提供非常有效的非易失性方法，以通过存储器修整来匹配逻辑存储器接口，大大降低成本和所涉及的周期时间。
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公开(公告)号：US20050213411A1
公开(公告)日：2005-09-29
申请号：US11121387
申请日：2005-05-03
CPC分类号： G11C29/027 , G11C29/028 , G11C29/50 , G11C29/50012
摘要： Electrical fuses (eFuses) are applied to the task of memory performance adjustment to improve upon earlier fuse techniques by not requiring an additional processing step and expensive equipment. Standard electrical fuse (eFuse) hardware chains provide a soft test feature wherein the effect of memory slow-down can be tested prior to actually programming the fuses. Electrical fuses thus provide a very efficient non-volatile method to match the logic-memory interface through memory trimming, drastically cutting costs and cycle times involved.
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公开(公告)号：US07793094B2
公开(公告)日：2010-09-07
申请号：US11406107
申请日：2006-04-18
CPC分类号： H04L63/1441 , H04L63/0435 , H04L63/0471 , H04L63/123 , H04L67/14 , H04L67/146
摘要： An intrusion detection system and method for a computer network includes a processor and one or more programs that run on the processor for application inspection of data packets traversing the computer network. The one or more programs also obtaining attribute information from the packets specific to a particular application and comparing the attribute information against a knowledge database that provides a baseline of normal network behavior. The processor raises an alarm whenever the attribute information exceeds a predetermined range of deviation from the baseline of normal network behavior.
摘要翻译： 用于计算机网络的入侵检测系统和方法包括处理器和在处理器上运行的一个或多个程序，用于对遍历计算机网络的数据分组进行应用检查。 一个或多个程序还从特定于特定应用的分组中获取属性信息，并将属性信息与提供正常网络行为基准的知识数据库进行比较。 每当属性信息超出与正常网络行为的基线偏离的预定范围时，处理器就会发出报警。
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公开(公告)号：US20070245137A1
公开(公告)日：2007-10-18
申请号：US11406107
申请日：2006-04-18
IPC分类号： H04L9/00
CPC分类号： H04L63/1441 , H04L63/0435 , H04L63/0471 , H04L63/123 , H04L67/14 , H04L67/146
摘要： A security device for a network operates to inspect data packet traffic outgoing from an application server, the data packet traffic including a data packet destined for a client device, the data packet containing a cookie created by the application server. The security device is further operable to extract the cookie from the data packet, encrypt the cookie using a secure key, and then send the encrypted cookie to the client device for storage thereon. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.
摘要翻译： 用于网络的安全设备用于检查从应用服务器传出的数据分组流量，所述数据分组流量包括去往客户端设备的数据分组，该数据分组包含由应用服务器创建的cookie。 安全设备还可操作以从数据包中提取cookie，使用安全密钥加密cookie，然后将加密的cookie发送到客户端设备以存储在其上。 要强调的是，该摘要被提供以符合要求抽象的规则，允许搜索者或其他读者快速确定技术公开内容的主题。 提交它的理解是，它不会用于解释或限制权利要求的范围或含义。
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公开(公告)号：US20050024960A1
公开(公告)日：2005-02-03
申请号：US10630963
申请日：2003-07-30
CPC分类号： G11C29/027 , G11C29/028 , G11C29/50 , G11C29/50012
摘要： Electrical fuses (eFuses) are applied to the task of memory performance adjustment to improve upon earlier fuse techniques by not requiring an additional processing step and expensive equipment. Standard electrical fuse (eFuse) hardware chains provide a soft test feature wherein the effect of memory slow-down can be tested prior to actually programming the fuses. Electrical fuses thus provide a very efficient non-volatile method to match the logic-memory interface through memory trimming, drastically cutting costs and cycle times involved.
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公开(公告)号：US07095671B2
公开(公告)日：2006-08-22
申请号：US11121387
申请日：2005-05-03
IPC分类号： G11C7/00
CPC分类号： G11C29/027 , G11C29/028 , G11C29/50 , G11C29/50012
摘要： Electrical fuses (eFuses) are applied to the task of memory performance adjustment to improve upon earlier fuse techniques by not requiring an additional processing step and expensive equipment. Standard electrical fuse (eFuse) hardware chains provide a soft test feature wherein the effect of memory slow-down can be tested prior to actually programming the fuses. Electrical fuses thus provide a very efficient non-volatile method to match the logic-memory interface through memory trimming, drastically cutting costs and cycle times involved.
摘要翻译： 电气保险丝（eFuse）被应用于存储器性能调整的任务，以通过不需要额外的处理步骤和昂贵的设备来改进早期保险丝技术。 标准电熔丝（eFuse）硬件链提供了软测试功能，其中可以在实际编程保险丝之前测试存储器减速的影响。 因此，电熔丝提供非常有效的非易失性方法，以通过存储器修整来匹配逻辑存储器接口，大大降低成本和所涉及的周期时间。
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