公开(公告)号：US20100159121A1

公开(公告)日：2010-06-24

申请号：US12621508

申请日：2009-11-19

Applicant: Reena Meijer Drees ,  Gertjan Hofman

Inventor： Reena Meijer Drees ,  Gertjan Hofman

IPC: B05D1/00 ,  G01D18/00 ,  G01J1/42

CPC classification number: G01B15/00 ,  G01B15/02 ,  G01B15/025 ,  G01D5/50

Abstract: An improved differential coat weight technique employs a novel algorithm for measuring the weight of a coating material that has been deposited onto a sheet of substrate. The invention employs dual x-ray or nuclear gauges such that, even though the downstream sensor is never exposed to uncoated sheet substrate, imparting the downstream sensor with the ability to predict results that it would have yielded when measuring the uncoated sheet substrate, leads to the development of a coat weight calibration protocol from which the basis weight of the coating can be ascertained directly from measurements from the upstream and downstream sensors. No subtraction of results is required. Moreover, the two sensors do not need to be re-calibrated whenever the relative proportions of the coating and base substrate change. The technique is particularly suited for applications where the coating material and substrate are made of substances that have very different atomic numbers.

Abstract translation: 改进的差速涂层重量技术采用新颖的算法来测量已沉积在基片上的涂层材料的重量。 本发明采用双X射线或核仪表，使得即使下游传感器从未暴露于未涂覆的片材基底，赋予下游传感器预测在测量未涂覆片材基底时可能产生的结果的能力，导致 开发涂层重量校准方案，可以从上游和下游传感器的测量直接确定涂层的基重。 不需要减去结果。 此外，只要涂层和基底的相对比例改变，两个传感器就不需要重新校准。 该技术特别适用于涂料和基材由具有非常不同原子序数的物质制成的应用。

公开(公告)号：US09612213B2

公开(公告)日：2017-04-04

申请号：US14517762

申请日：2014-10-17

Applicant: Reena Meijer Drees ,  Gertjan Hofman

Inventor： Reena Meijer Drees ,  Gertjan Hofman

IPC: G01N23/16 ,  G01N23/09 ,  G01G17/02 ,  G01G9/00

CPC classification number: G01N23/16 ,  G01G9/005 ,  G01G17/02 ,  G01N23/09 ,  G01N2223/04 ,  G01N2223/102 ,  G01N2223/6425

Abstract: Nuclear-based basis weight sensors are passline-sensitive. Error in measurement is induced when the sheet moves up and down in the gap between the radiation source and detector. A passline-insensitive basis weight sensor includes a triangulation sensor to measure the position of the sheet within the gap. The sensor and gap is characterized in the laboratory for its passline behavior over a range of basis weights. The curves are either parameterized or a lookup table is created for each weight and passline position and the data added to the sensor's processor. The basis weight measured can be automatically corrected to account for deviations from the passline or nominal path through the sensor.

公开(公告)号：US20150323375A1

公开(公告)日：2015-11-12

申请号：US14517762

申请日：2014-10-17

Applicant: Reena Meijer Drees ,  Gertjan Hofman

Inventor： Reena Meijer Drees ,  Gertjan Hofman

IPC: G01G9/00 ,  G01N23/16 ,  G01G17/02 ,  G01N23/09

CPC classification number: G01N23/16 ,  G01G9/005 ,  G01G17/02 ,  G01N23/09 ,  G01N2223/04 ,  G01N2223/102 ,  G01N2223/6425

Abstract: Nuclear-based basis weight sensors are passline-sensitive. Error in measurement is induced when the sheet moves up and down in the gap between the radiation source and detector. A passline-insensitive basis weight sensor includes a triangulation sensor to measure the position of the sheet within the gap. The sensor and gap is characterized in the laboratory for its passline behavior over a range of basis weights. The curves are either parameterized or a lookup table is created for each weight and passline position and the data added to the sensor's processor. The basis weight measured can be automatically corrected to account for deviations from the passline or nominal path through the sensor.

Abstract translation: 基于核的基重传感器是通过线路敏感的。 当片材在辐射源和检测器之间的间隙中上下移动时，会引起测量误差。 无线传感器的基重传感器包括三角测量传感器，用于测量间隙内片材的位置。 传感器和间隙在实验室中的特征在于在一定范围的基重上的通行行为。 曲线既可以参数化，也可以为每个加权和通行位置以及添加到传感器处理器的数据创建查找表。 测量的基重可以自动校正，以解决通过传感器的通行线或标称路径的偏差。

公开(公告)号：US08394449B2

公开(公告)日：2013-03-12

申请号：US12621508

申请日：2009-11-19

Applicant: Reena Meijer Drees ,  Gertjan Hofman

Inventor： Reena Meijer Drees ,  Gertjan Hofman

IPC: C23C16/52 ,  G01T1/167 ,  H04N5/33

CPC classification number: G01B15/00 ,  G01B15/02 ,  G01B15/025 ,  G01D5/50

Abstract: An improved differential coat weight technique employs a novel algorithm for measuring the weight of a coating material that has been deposited onto a sheet of substrate. The invention employs dual x-ray or nuclear gauges such that, even though the downstream sensor is never exposed to uncoated sheet substrate, imparting the downstream sensor with the ability to predict results that it would have yielded when measuring the uncoated sheet substrate, leads to the development of a coat weight calibration protocol from which the basis weight of the coating can be ascertained directly from measurements from the upstream and downstream sensors. No subtraction of results is required. Moreover, the two sensors do not need to be re-calibrated whenever the relative proportions of the coating and base substrate change. The technique is particularly suited for applications where the coating material and substrate are made of substances that have very different atomic numbers.

Abstract translation: 改进的差速涂层重量技术采用新颖的算法来测量已沉积在基片上的涂层材料的重量。 本发明采用双X射线或核仪表，使得即使下游传感器从未暴露于未涂覆的片材基底，赋予下游传感器预测在测量未涂覆片材基底时可能产生的结果的能力，导致 开发涂层重量校准方案，可以从上游和下游传感器的测量直接确定涂层的基重。 不需要减去结果。 此外，只要涂层和基底的相对比例改变，两个传感器就不需要重新校准。 该技术特别适用于涂料和基材由具有非常不同原子序数的物质制成的应用。

公开(公告)号：US08464572B2

公开(公告)日：2013-06-18

申请号：US12899707

申请日：2010-10-07

Applicant: Adam Krolak ,  Reena Meijer Drees ,  Frank M. Haran ,  Sebastien Tixier

Inventor： Adam Krolak ,  Reena Meijer Drees ,  Frank M. Haran ,  Sebastien Tixier

IPC: G01N33/18

CPC classification number: G01N33/18 ,  G01N21/15 ,  G01N21/276 ,  G01N21/3577 ,  G01N21/552 ,  G01N21/8507 ,  G01N33/0029 ,  G01N2021/152

Abstract: A system includes a signal source that provides a first signal for measuring a gas content of a liquid sample. The system also includes an analyzer that determines the gas content of the liquid sample using a measurement of a second signal, where the second signal is based on the first signal. The system further includes an apparatus with a walled structure having a cavity. The apparatus also includes a piston that pulls the liquid sample into the cavity and pushes the liquid sample out of the cavity. The apparatus further includes at least one measurement window having at least one inner surface exposed within the cavity. The at least one measurement window receives the first signal from the signal source and provides the second signal to the analyzer. The piston could also clean the at least one inner surface, and the piston can include a reference material for calibrating the analyzer.

Abstract translation: 一种系统包括提供用于测量液体样品的气体含量的第一信号的信号源。 该系统还包括分析器，其使用第二信号的测量来确定液体样品的气体含量，其中第二信号基于第一信号。 该系统还包括具有空腔的具有壁结构的装置。 该装置还包括将液体样品拉入空腔并将液体样品推出空腔的活塞。 该装置还包括至少一个测量窗口，其具有暴露在空腔内的至少一个内表面。 所述至少一个测量窗口从信号源接收第一信号，并向分析器提供第二信号。 活塞还可以清洁至少一个内表面，并且活塞可以包括用于校准分析器的参考材料。

公开(公告)号：US07399971B2

公开(公告)日：2008-07-15

申请号：US11317693

申请日：2005-12-23

Applicant: Gertjan J. Hofman ,  Reena Meijer Drees

Inventor： Gertjan J. Hofman ,  Reena Meijer Drees

IPC: G01F23/00

CPC classification number: G01N33/44 ,  G01N23/16 ,  G01N33/346 ,  G01N2223/1006

Abstract: An apparatus, method and computer program product for determining a concentration of a high-Z material in a material sample. The method comprises steps of: receiving a material sample and subjecting the material sample to a first sensor device that is substantially ash insensitive for generating a first sensor response signal, and a second sensor device that is sensitive to presence of high-Z material and generating a second sensor response signal. Both the first and second sensor response signals from the first and second sensor devices are processed simultaneously to extract a weight of the high-Z material additive. The weight of the high-Z material additive is determined in a single scan of the material sample.

Abstract translation: 一种用于确定材料样品中高Z材料浓度的装置，方法和计算机程序产品。 该方法包括以下步骤：接收材料样品并使材料样品经受对于产生第一传感器响应信号基本上不敏感的第一传感器装置，以及对存在高Z材料敏感的第二传感器装置，并产生 第二传感器响应信号。 来自第一和第二传感器装置的第一和第二传感器响应信号都被同时处理以提取高Z材料添加剂的重量。 在材料样品的单次扫描中确定高Z材料添加剂的重量。

公开(公告)号：US20120085144A1

公开(公告)日：2012-04-12

申请号：US12899707

申请日：2010-10-07

Applicant: Adam Krolak ,  Reena Meijer Drees ,  Frank M. Haran ,  Sebastien Tixier

Inventor： Adam Krolak ,  Reena Meijer Drees ,  Frank M. Haran ,  Sebastien Tixier

IPC: G01N33/18

CPC classification number: G01N33/18 ,  G01N21/15 ,  G01N21/276 ,  G01N21/3577 ,  G01N21/552 ,  G01N21/8507 ,  G01N33/0029 ,  G01N2021/152

Abstract: A system includes a signal source that provides a first signal for measuring a gas content of a liquid sample. The system also includes an analyzer that determines the gas content of the liquid sample using a measurement of a second signal, where the second signal is based on the first signal. The system further includes an apparatus with a walled structure having a cavity. The apparatus also includes a piston that pulls the liquid sample into the cavity and pushes the liquid sample out of the cavity. The apparatus further includes at least one measurement window having at least one inner surface exposed within the cavity. The at least one measurement window receives the first signal from the signal source and provides the second signal to the analyzer. The piston could also clean the at least one inner surface, and the piston can include a reference material for calibrating the analyzer.

Abstract translation: 一种系统包括提供用于测量液体样品的气体含量的第一信号的信号源。 该系统还包括分析器，其使用第二信号的测量来确定液体样品的气体含量，其中第二信号基于第一信号。 该系统还包括具有空腔的具有壁结构的装置。 该装置还包括将液体样品拉入空腔并将液体样品推出空腔的活塞。 该装置还包括至少一个测量窗口，其具有暴露在空腔内的至少一个内表面。 所述至少一个测量窗口从信号源接收第一信号，并向分析器提供第二信号。 活塞还可以清洁至少一个内表面，并且活塞可以包括用于校准分析器的参考材料。