公开(公告)号：US09006673B2

公开(公告)日：2015-04-14

申请号：US13905559

申请日：2013-05-30

申请人： Rigaku Corporation

发明人： Kazuki Ito ,  Yoshinori Ueji ,  Koichi Kajiyoshi ,  Kunio Nishi

IPC分类号： G01T1/17

CPC分类号： G01T1/17

摘要： An X-ray analysis apparatus converts an X-ray intensity distribution of discrete data determined for each pixel, from a first plane where the distribution is known into a second plane where the distribution is not known. The X-ray analysis apparatus projects onto the second plane, a grid point which specifies a pixel on the first plane and an intermediate point between the grid points, as nodes, calculates an area of a region where a polygon expressing a projected pixel specified by the projected nodes overlaps with each pixel on the second plane, to thereby calculate an occupancy ratio of the polygon expressing the projected pixel to each pixel on the second plane and distributes X-ray intensity in the pixel on the first plane to the pixel on the second plane based on the occupancy ratio, to thereby convert the X-ray intensity distribution.

摘要翻译： X射线分析装置将从每个像素确定的离散数据的X射线强度分布从分布已知的第一平面转换为分布未知的第二平面。 X射线分析装置投射到第二平面上，指定第一平面上的像素的网格点和作为节点的网格点之间的中间点，计算区域的区域，其中表示由 投影节点与第二平面上的每个像素重叠，从而计算出表示投影像素的多边形与第二平面上的每个像素的占有率，并将第一平面上的像素中的X射线强度分配给第二平面上的像素 基于占有率的第二平面，从而转换X射线强度分布。

公开(公告)号：US10429325B2

公开(公告)日：2019-10-01

申请号：US15259581

申请日：2016-09-08

申请人： Rigaku Corporation

发明人： Kazuki Ito ,  Kazuhiko Omote ,  Licai Jiang

IPC分类号： G01N23/201

摘要： Provided is an X-ray small angle optical system, which easily achieves a desired angular resolution, including: an X-ray source having a microfocus; a multilayer mirror having an elliptical reflection surface, and being configured to collect X-rays emitted from the X-ray source and to irradiate a sample; and an X-ray detector configured to detect scattered X-rays generated from the sample, in which the elliptical reflection surface of the multilayer mirror has a focal point A and a focal point B, in which the X-ray source is arranged such that the microfocus includes the focal point A, and in which the X-ray detector is arranged on the multilayer mirror side of the focal point B.

公开(公告)号：US10145808B2

公开(公告)日：2018-12-04

申请号：US15114209

申请日：2015-02-02

申请人： RIGAKU CORPORATION

发明人： Kazuhiko Omote ,  Kazuki Ito

IPC分类号： G01N23/201 ,  G21K1/10 ,  G21K1/06

摘要： A micro beam generation unit capable of simultaneously capturing anisotropic images in a high signal-to-background ratio with a compact configuration and an X-ray small-angle scattering apparatus are provided. A micro beam generation unit 110 generates X-rays having a micro spot size, with which a sample is irradiated, in order to detect diffracted X-rays by a one-dimensional detector or a two-dimensional detector. The micro beam generation unit 110 includes a slit 115 that is provided on an X-ray optical path and reshapes X-rays into parallel beams, and two channel-cut monochromator crystals 117 and 118 that are arranged in arrangement of (+, −, −, +) and remove parasitic scattering of parallel beams reshaped by the slit. Accordingly, it is possible to simultaneously obtain anisotropic images in a high signal-to-background ratio with a compact configuration.

公开(公告)号：US20170010226A1

公开(公告)日：2017-01-12

申请号：US15114209

申请日：2015-02-02

申请人： RIGAKU CORPORATION

发明人： Kazuhiko Omote ,  Kazuki Ito

IPC分类号： G01N23/201 ,  G21K1/06

CPC分类号： G01N23/201 ,  G01N2223/054 ,  G01N2223/056 ,  G01N2223/315 ,  G21K1/06 ,  G21K1/10

摘要： A micro beam generation unit capable of simultaneously capturing anisotropic images in a high signal-to-background ratio with a compact configuration and an X-ray small-angle scattering apparatus are provided. A micro beam generation unit 110 generates X-rays having a micro spot size, with which a sample is irradiated, in order to detect diffracted X-rays by a one-dimensional detector or a two-dimensional detector. The micro beam generation unit 110 includes a slit 115 that is provided on an X-ray optical path and reshapes X-rays into parallel beams, and two channel-cut monochromator crystals 117 and 118 that are arranged in arrangement of (+, −, −, +) and remove parasitic scattering of parallel beams reshaped by the slit. Accordingly, it is possible to simultaneously obtain anisotropic images in a high signal-to-background ratio with a compact configuration.

摘要翻译： 提供了一种能够以紧凑型配置和X射线小角度散射装置同时捕获高信号到背景比的各向异性图像的微光束产生单元。 为了通过一维检测器或二维检测器检测衍射X射线，微光束产生单元110产生具有照射样品的微点尺寸的X射线。 微光束产生单元110包括设置在X射线光路上并将X射线成为平行光束的狭缝115，以及排列成（+， - ， - ）的两个通道切割单色仪晶体117和118， - ，+），并消除由狭缝重新形成的平行光束的寄生散射。 因此，可以以紧凑的结构同时获得高信号到背景比的各向异性图像。