摘要:
A test interface adapter allows a line-conditioning or test device, such as a direct access test unit (DATU), that is normally interfaced with a standard central office switch via a no-test trunk, to be coupled to and communicate with the respective ports of a test interface of a non-standard central office switch that is not equipped with a no test trunk, so that conditioning and/or testing of subscriber telephone lines served by such non-standard central office switch may be carried out. When so installed, the interface adapter of the present invention is operative to map signals at first interface ports, to which the non-standard central office switch is connected, to second interface ports to which the line conditioning/test device (e.g DATU) is connected, and vice versa. The port lead and signal mapping functionality of the interface allows the accessing device to communicate with the respective ports of what would otherwise be a non-compatible test interface of the central office switch, so that it may controllably condition and/or test line circuits of the `NTT-less` central office switch.
摘要:
A test interface adapter allows a line-conditioning or test device, such as a direct access test unit (DATU), that is normally interfaced with a standard central office switch via a no-test trunk, to be coupled to and communicate with the respective ports of a test interface of a non-standard central office switch that is not equipped with a no test trunk, so that conditioning and/or testing of subscriber telephone lines served by such non-standard central office switch may be carried out. When so installed, the interface adapter of the present invention is operative to map signals at first interface ports, to which the non-standard central office switch is connected, to second interface ports to which the line conditioning/test device (e.g DATU) is connected, and vice versa. The port lead and signal mapping functionality of the interface allows the accessing device to communicate with the respective ports of what would otherwise be a non-compatible test interface of the central office switch, so that it may controllably condition and/or test line circuits of the `NTT-less` central office switch.
摘要:
A processor-controlled integrated telephone line measurement and conditioning apparatus installable at a remote site provides a multiplicity of measurement and conditioning functions that are selectively executable in response to commands issued from a supervisory command site. The dual measurement and conditioning capabilities of the architecture of the present invention impart both remote measurement unit (RMU) functionality and metallic access unit (MAU) functionality that may be individually accessed and controlled. The RMU operates primarily as a test head that performs mechanized loop testing (MLT) tasks, while the MAU is operative to impart prescribed electrical conditions to a specified line circuit. When controllably accessed to operate as an RMU, the present invention responds to instructions from a command site (loop maintenance operations systems) and performs single-line demand tests on a line provided by a pair gain system. To operate as an MAU, the system receives commands from a direct access test unit (DATU) and performs line conditioning functions on the test line provided by the pair gain system.