公开(公告)号：US20240210465A1

公开(公告)日：2024-06-27

申请号：US18556158

申请日：2022-04-29

申请人： Robert Bosch GmbH

发明人： Andreas Schmidtlein ,  Simeon Lange

IPC分类号： G01R31/28 ,  G01R31/26

CPC分类号： G01R31/2817 ,  G01R31/2642

摘要： A method for determining wear in an electronic unit, in particular a power electronics unit, which includes at least one electronic component, in particular a semiconductor component, capacitor or the like. The unit is subjected to a test procedure in which at least two predefinable electrical load cycles are applied to the unit, in which cycles the unit is operated in each case in order to simulate at least one selected operating mode for a predefined period of time. During the test procedure, electromagnetic waves generated by the unit by an electrical load resulting from the application of the at least two load cycles to the unit are detected for at least two of the load cycles, and the detected electromagnetic waves of the at least two load cycles are compared with one another in order to detect wear in the unit.

公开(公告)号：US12038466B2

公开(公告)日：2024-07-16

申请号：US17793033

申请日：2021-04-08

申请人： Robert Bosch GmbH

发明人： Andreas Schmidtlein ,  Simeon Lange

IPC分类号： G01R31/12 ,  G01R31/00

CPC分类号： G01R31/1218 ,  G01R31/006

摘要： A testing apparatus for testing electrical components and/or conductor track structures. The testing apparatus includes: a multiplicity of testing locations, each receiving an electrical component and/or a conductor track structure; a selection device for selecting one of the testing locations; electrical lines disposed in rows and electrical lines disposed in columns for the supply of an alternating voltage to the component or structure, situated at the selected testing location; Z diodes for the electrical connection of the respective component and/or structure at the respective testing location via one of the Z diodes to one of the rows of electrical lines; a signal generator developed to generate a test signal that has a voltage signal as the sum of a square wave signal and a wave-shaped signal; and an electromigration device for applying a direct voltage signal to the components and/or structures to bring about electromigration in the components and/or structures.

公开(公告)号：US20230038552A1

公开(公告)日：2023-02-09

申请号：US17793033

申请日：2021-04-08

申请人： Robert Bosch GmbH

发明人： Andreas Schmidtlein ,  Simeon Lange

IPC分类号： G01R31/12 ,  G01R31/00

摘要： A testing apparatus for testing electrical components and/or conductor track structures. The testing apparatus includes: a multiplicity of testing locations, each receiving an electrical component and/or a conductor track structure; a selection device for selecting one of the testing locations; electrical lines disposed in rows and electrical lines disposed in columns for the supply of an alternating voltage to the component or structure, situated at the selected testing location; Z diodes for the electrical connection of the respective component and/or structure at the respective testing location via one of the Z diodes to one of the rows of electrical lines; a signal generator developed to generate a test signal that has a voltage signal as the sum of a square wave signal and a wave-shaped signal; and an electromigration device for applying a direct voltage signal to the components and/or structures to bring about electromigration in the components and/or structures.