公开(公告)号：US20060027544A1

公开(公告)日：2006-02-09

申请号：US10912525

申请日：2004-08-04

申请人： Robert Pailthorp ,  Weisheng Lei ,  Hisashi Matsumoto ,  Glenn Simenson ,  David Watt ,  Mark Unrath ,  William Jordens

发明人： Robert Pailthorp ,  Weisheng Lei ,  Hisashi Matsumoto ,  Glenn Simenson ,  David Watt ,  Mark Unrath ,  William Jordens

IPC分类号： B23K26/38

CPC分类号： H05K3/0026 ,  B23K26/389 ,  H05K2201/09063

摘要： High speed removal of material from a specimen employs a beam positioner for directing a laser beam axis along various circular and spiral laser tool patterns. A preferred method of material removal entails causing relative movement between the axis of the beam and the specimen, directing the beam axis at an entry segment acceleration and along an entry trajectory to an entry position within the specimen at which laser beam pulse emissions are initiated, moving the beam axis at a circular perimeter acceleration within the specimen to remove material along a circular segment of the specimen, and setting the entry segment acceleration to less than twice the circular perimeter acceleration.

摘要翻译： 从样品高速去除材料采用光束定位器，用于沿着各种圆形和螺旋形激光工具图案引导激光束轴线。 优选的材料去除方法需要引起梁的轴线和样品之间的相对运动，将束轴线以入口段加速度并沿着入口轨迹引导到在激光束脉冲发射开始的样本内的入口位置， 沿着试样中的圆周边加速度移动光束轴，以沿着试样的圆形段移除材料，并将进入段加速度设置为小于圆周边加速度的两倍。

公开(公告)号：US20060065646A1

公开(公告)日：2006-03-30

申请号：US11218283

申请日：2005-08-31

申请人： Robert Pailthorp ,  Brandon McCurry

发明人： Robert Pailthorp ,  Brandon McCurry

IPC分类号： B23K26/36

CPC分类号： H01C17/242 ,  B23K26/0006 ,  B23K26/0624 ,  B23K26/066 ,  B23K26/351 ,  B23K26/361 ,  B23K2103/50 ,  B23K2103/52

摘要： Thermoelectric effects that occur during laser trimming of resistors (20) are resolved by taking voltage measurements. The voltage attributed to laser heating on a resistor (20) during a low-power simulated trim (10) is used to determine a relatively thermal-neutral location (18) on the resistor (20). A trimming-to-value operation can then be performed on all like resistors (20). Voltage measurements can also be taken before and after every pulse in a trimming operation to establish thermal deviation information that can be used to offset the desired trim value against which resistor measurement values are compared. Spatially distant or nonadjacent resistors (20) in a row or column can also be trimmed sequentially to minimize heating effects that might otherwise distort resistance values on adjacent or nearby resistors (20).

摘要翻译： 在电阻（20）的激光微调期间发生的热电效应通过采取电压测量来解决。 用于在低功率模拟微调（10）期间归因于电阻器（20）上的激光加热的电压用于确定电阻器（20）上的相对热中性位置（18）。 然后可以对所有类似的电阻器（20）执行修整到值的操作。 也可以在修整操作中的每个脉冲之前和之后进行电压测量，以建立热偏差信息，该热偏差信息可用于抵消与哪个电阻测量值进行比较的期望的微调值。 也可以顺序修剪行或列中的空间较远或不相邻的电阻器（20），以最小化否则可能在相邻或附近的电阻器（20）上扭曲电阻值的加热效应。

公开(公告)号：US20060055504A1

公开(公告)日：2006-03-16

申请号：US11218302

申请日：2005-08-31

申请人： Robert Pailthorp ,  Brandon McCurry

发明人： Robert Pailthorp ,  Brandon McCurry

IPC分类号： H01C10/00

CPC分类号： H01C17/242 ,  B23K26/0006 ,  B23K26/0624 ,  B23K26/066 ,  B23K26/351 ,  B23K26/361 ,  B23K2103/50 ,  B23K2103/52

摘要： Thermoelectric effects that occur during laser trimming of resistors (20) are resolved by taking voltage measurements. The voltage attributed to laser heating on a resistor (20) during a low-power simulated trim (10) is used to determine a relatively thermal-neutral location (18) on the resistor (20). A trimming-to-value operation can then be performed on all like resistors (20). Voltage measurements can also be taken before and after every pulse in a trimming operation to establish thermal deviation information that can be used to offset the desired trim value against which resistor measurement values are compared. Spatially distant or nonadjacent resistors (20) in a row or column can also be trimmed sequentially to minimize heating effects that might otherwise distort resistance values on adjacent or nearby resistors (20).

摘要翻译： 在电阻（20）的激光微调期间发生的热电效应通过采取电压测量来解决。 用于在低功率模拟微调（10）期间归因于电阻器（20）上的激光加热的电压用于确定电阻器（20）上的相对热中性位置（18）。 然后可以对所有类似的电阻器（20）执行修整到值的操作。 也可以在修整操作中的每个脉冲之前和之后进行电压测量，以建立热偏差信息，该热偏差信息可用于抵消与哪个电阻测量值进行比较的期望的微调值。 也可以顺序修剪行或列中的空间较远或不相邻的电阻器（20），以最小化否则可能在相邻或附近的电阻器（20）上扭曲电阻值的加热效应。