Noise compensation circuit for image sensors
    1.
    发明授权
    Noise compensation circuit for image sensors 失效
    图像传感器噪声补偿电路

    公开(公告)号:US5981932A

    公开(公告)日:1999-11-09

    申请号:US964571

    申请日:1997-11-05

    摘要: Disclosed is a method and associated apparatus for compensating for kTC noise in individual pixels of an MOS imaging array. The kTC noise at issue forms when a pixel is disconnected from a reset voltage by turning off an MOS transistor which controls access to the pixel photodiode. Compensation is accomplished by first exposing the photodiode to the reset voltage and then disconnecting the well region from V.sub.dd to cause it to float. By allowing the well to float, the kTC charge subsequently introduced (at the conclusion of the reset process) redistributes so that most of it accumulates on the capacitor between the well and the substrate. Later, the well is reclamped to V.sub.dd, and the noise contribution stored in the well-substrate capacitor is canceled. A disclosed apparatus includes an array of pixels, each having a separate well. In addition, access of the well to a source of power (V.sub.dd) must be switchable. Therefore, a transistor is included at each pixel's connection to a V.sub.dd.

    摘要翻译: 公开了用于补偿MOS成像阵列的各个像素中的kTC噪声的方法和相关装置。 通过关闭控制对像素光电二极管的访问的MOS晶体管,当像素与复位电压断开时,形成所讨论的kTC噪声。 通过首先将光电二极管暴露于​​复位电压,然后将阱区域与Vdd断开以使其浮动来实现补偿。 通过允许阱浮动,随后引入的kTC电荷(在复位过程结束时)重新分布,使得其大部分积聚在阱和衬底之间的电容器上。 之后,井被放大到Vdd,并且消除了存储在井底电容器中的噪声贡献。 公开的装置包括像素阵列,每个像素阵列具有单独的孔。 此外,井到电源(Vdd)的访问必须是可切换的。 因此,在每个像素与Vdd的连接处包括晶体管。

    Touchpad computer input system and method
    2.
    发明授权
    Touchpad computer input system and method 有权
    触摸板电脑输入系统及方法

    公开(公告)号:US06292173B1

    公开(公告)日:2001-09-18

    申请号:US09151558

    申请日:1998-09-11

    IPC分类号: G09G508

    CPC分类号: G06F3/044

    摘要: A method of and system for providing user input to a computer captures a first finger position image at a first time and a second finger position image at a second time. The first and second finger position images each comprise a plurality of numerical gray scale values equal to or greater than zero. The system then subtracts the first finger position image from the second finger position image to obtain a composite image. The composite image has a first region comprising numerical values less than zero and a second region comprising numerical values greater than zero. The system provides X-Y input to the computer based upon the relative positions of first and second regions. The system further provides Z input to the computer based upon the relative sizes of said first and second regions.

    摘要翻译: 用于向计算机提供用户输入的方法和系统在第二时间捕获第一手指位置图像和第二手指位置图像。 第一和第二手指位置图像各自包括等于或大于零的多个数字灰度值。 然后,系统从第二手指位置图像中减去第一手指位置图像以获得合成图像。 合成图像具有包括小于零的数值的第一区域和包括大于零的数值的第二区域。 该系统基于第一和第二区域的相对位置向计算机提供X-Y输入。 该系统还基于所述第一和第二区域的相对大小向计算机提供Z输入。

    Pixel correction system and method for CMOS imagers
    3.
    发明授权
    Pixel correction system and method for CMOS imagers 有权
    CMOS像素校正系统及方法

    公开(公告)号:US07535502B2

    公开(公告)日:2009-05-19

    申请号:US10613830

    申请日:2003-07-03

    IPC分类号: H04N9/64

    CPC分类号: H04N5/367 H04N5/374

    摘要: Disclosed is a fault tolerant CMOS image sensor that includes circuitry for identifying defective pixels and masking them during image generation. Masking may involve, in one example, replacing the output of a given pixel with an average of the output of surrounding non-faulty pixels. Thus, while image sensors may be fabricated with some number of faulty pixels, the images produced by such sensors will not have undesirable bright or dark spots. The disclosed sensor includes (a) one or more pixels (active or passive) capable of providing outputs indicative of a quantity of radiation to which each of the one or more pixels has been exposed; and (b) one or more circuit elements electrically coupled to the one or more pixels and configured to identify and correct faulty pixels in the CMOS imager. The one more pixels each include a photodiode diffusion formed in a well and a tap to power or ground also formed in the well. The disclosed sensor also identifies pixels that were initially acceptable but later became defective. The newly defective pixels so identified may then be masked to thereby increase the CMOS detector lifetime.

    摘要翻译: 公开了一种容错CMOS图像传感器,其包括用于识别缺陷像素并在图像生成期间对其进行掩蔽的电路。 在一个示例中,掩蔽可以包括用周围的非故障像素的输出的平均值代替给定像素的输出。 因此,虽然图像传感器可以被制造成具有若干数量的有缺陷的像素,但由这种传感器产生的图像将不会有不期望的明亮或暗点。 所公开的传感器包括(a)能够提供指示一个或多个像素中的每一个已被暴露的辐射量的输出的一个或多个像素(有源或无源) 和(b)一个或多个电路元件,其电耦合到所述一个或多个像素并且被配置为识别和校正所述CMOS成像器中的有缺陷的像素。 每一个像素都包括在阱中形成的光电二极管扩散器和也形成在阱中的电源或接地的抽头。 所公开的传感器还识别最初可接受但后来变得有缺陷的像素。 然后可以掩蔽如此识别的新缺陷像素,从而增加CMOS检测器的寿命。

    Circuit for detecting leaky access switches in CMOS imager pixels
    4.
    发明授权
    Circuit for detecting leaky access switches in CMOS imager pixels 失效
    用于检测CMOS成像器像素中漏电接入开关的电路

    公开(公告)号:US06504572B2

    公开(公告)日:2003-01-07

    申请号:US08964762

    申请日:1997-11-05

    IPC分类号: H04N314

    CPC分类号: H04N5/367 H04N5/374

    摘要: Disclosed is a CMOS image sensor that includes circuitry for identifying defective pixels, particularly pixels having leaky access switches. The leaky access switches allow charge to escape from the pixel over a row or column line in a pixel array, thereby corrupting the outputs of an entire row or column of pixels. A disclosed test involves (a) electronically setting a defined charge in a selected pixel of the CMOS imager; (b) reading the output of the selected pixel; and (c) comparing the output of the selected pixel to an expected value based upon the defined charge set in the selected pixels. If the output significantly deviates from the expected value, then the selected pixel is identified as having a leaky access switch. Preferably, a newly fabricated sensor is first tested as described. If such leaky access switch is discovered, the imager is discarded without incurring further manufacturing cost. If, on the other hand, the imager is not found to contain a leaky access switch, it may packaged and then subjected to an optical test.

    摘要翻译: 公开了一种CMOS图像传感器,其包括用于识别缺陷像素的电路,特别是具有泄漏接入开关的像素。 泄漏的访问开关允许电荷从像素阵列中的行或列线上的像素逸出,从而破坏整个像素行或列的输出。 公开的测试涉及(a)在CMOS成像器的选定像素中电子地设定定义的电荷; (b)读取所选像素的输出; 以及(c)基于所选择的像素中设定的定义的电荷,将所选像素的输出与预期值进行比较。 如果输出显着偏离预期值,则所选择的像素被识别为具有泄漏接入开关。 优选地,如上所述首先测试新制造的传感器。 如果发现这种泄漏接入交换机,则丢弃该成像器而不会产生进一步的制造成本。 另一方面,如果没有发现成像器含有泄漏接入开关,则可以对其进行打包,然后进行光学测试。

    Pixel correction system and method for CMOS imagers

    公开(公告)号:US06618084B1

    公开(公告)日:2003-09-09

    申请号:US08964763

    申请日:1997-11-05

    IPC分类号: H04N314

    CPC分类号: H04N5/367 H04N5/374

    摘要: Disclosed is a fault tolerant CMOS image sensor that includes circuitry for identifying defective pixels and masking them during image generation. Masking may involve, in one example, replacing the output of a given pixel with an average of the output of surrounding non-faulty pixels. Thus, while image sensors may be fabricated with some number of faulty pixels, the images produced by such sensors will not have undesirable bright or dark spots. The disclosed sensor includes (a) one or more pixels (active or passive) capable of providing outputs indicative of a quantity of radiation to which each of the one or more pixels has been exposed; and (b) one or more circuit elements electrically coupled to the one or more pixels and configured to identify and correct faulty pixels in the CMOS imager. The one more pixels each include a photodiode diffusion formed in a well and a tap to power or ground also formed in the well. The disclosed sensor also identifies pixels that were initially acceptable but later became defective. The newly defective pixels so identified may then be masked to thereby increase the CMOS detector lifetime.