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公开(公告)号:US08569891B1
公开(公告)日:2013-10-29
申请号:US12724491
申请日:2010-03-16
IPC分类号: G11C11/24
CPC分类号: H01L21/76807 , H01L21/76808 , H01L21/76811 , H01L21/76816 , H01L21/7684 , H01L21/76877 , H01L21/76895 , H01L23/5226 , H01L23/5283 , H01L27/1052 , H01L27/11521 , H01L2924/0002 , H01L2924/00
摘要: Array contacts for semiconductor memories may be formed using a first set of parallel stripe masks and subsequently a second set of parallel stripe masks transverse to the first set. For example, one set of masks may be utilized to etch a dielectric layer, to form parallel spaced trenches. Then the trenches may be filled with a sacrificial material. That sacrificial material may then be masked transversely to its length and etched, for example. The resulting openings may be filled with a metal to form array contacts.