摘要:
A parallel calibration system for an electronic circuit tester comprises test and measurement electronics, a test fixture coupled to the test and measurement electronics, the test fixture comprising clock reference circuitry and clock distribution circuitry, a device under test interface, and a plurality of calibration boards coupled to the device under test interface, wherein the plurality of calibration boards and the clock distribution circuitry simultaneously test the signal paths of a plurality of test channels.
摘要:
A parallel calibration system for an electronic circuit tester comprises test and measurement electronics, a test fixture coupled to the test and measurement electronics, the test fixture comprising clock reference circuitry and clock distribution circuitry, a device under test interface, and a plurality of calibration boards coupled to the device under test interface, wherein the plurality of calibration boards and the clock distribution circuitry simultaneously test the signal paths of a plurality of test channels.
摘要:
There is disclosed apparatus for routing signals between at least one PCB within a test head and a socket card assembly. In an embodiment, the apparatus may include at least one flexible circuit electrically connecting first and second sides of the PCB and the socket card assembly with one another, and the flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Methods of routing signals between at least one PCB within a test head and a socket card assembly are disclosed. In one embodiment, a method may include electrically connecting first and second sides of the PCB and the socket card assembly with one another with at least one flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Other embodiments are also disclosed.
摘要:
There is disclosed apparatus for routing signals between at least one PCB within a test head and a socket card assembly. In an embodiment, the apparatus may include at least one flexible circuit electrically connecting first and second sides of the PCB and the socket card assembly with one another, and the flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Methods of routing signals between at least one PCB within a test head and a socket card assembly are disclosed. In one embodiment, a method may include electrically connecting first and second sides of the PCB and the socket card assembly with one another with at least one flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Other embodiments are also disclosed.