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Patent Agency Ranking
公开(公告)号：US20240011913A1
公开(公告)日：2024-01-11
申请号：US18297737
申请日：2023-04-10
Applicant: Samsung Display Co., Ltd.
Inventor： Jinwook Lee , Changyun Moon , Hyunjoon Kim
CPC classification number: G01N21/88 , G09G3/006 , G09G2360/145
Abstract: A method of determining whether a display manufacturing facility is abnormal includes a first step of obtaining facility information data of facilities used to manufacture a display panel, a second step of preparing a display module by attaching a printed circuit board and a driving chip to the display panel, a third step of obtaining preliminary inspection data through an on-off test on the display module, a fourth step of associating the facility information data with the preliminary inspection data, establishing a database by repeatedly performing the first step to the fourth step, obtaining real-time inspection data through an on-off test on a display module to be inspected, determining whether the display module to be inspected is normal, and determining a facility causing abnormality of the display module, from the real-time inspection data by using the database, in case that the display module to be inspected is abnormal is determined.
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公开(公告)号：US12235220B2
公开(公告)日：2025-02-25
申请号：US18297737
申请日：2023-04-10
Applicant: Samsung Display Co., Ltd.
Inventor： Jinwook Lee , Changyun Moon , Hyunjoon Kim
Abstract: A method of determining whether a display manufacturing facility is abnormal includes a first step of obtaining facility information data of facilities used to manufacture a display panel, a second step of preparing a display module by attaching a printed circuit board and a driving chip to the display panel, a third step of obtaining preliminary inspection data through an on-off test on the display module, a fourth step of associating the facility information data with the preliminary inspection data, establishing a database by repeatedly performing the first step to the fourth step, obtaining real-time inspection data through an on-off test on a display module to be inspected, determining whether the display module to be inspected is normal, and determining a facility causing abnormality of the display module, from the real-time inspection data by using the database, in case that the display module to be inspected is abnormal is determined.
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公开(公告)号：US12072259B2
公开(公告)日：2024-08-27
申请号：US17367785
申请日：2021-07-06
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor： Sanghui Park , Jinwook Lee
CPC classification number: G01M11/0207 , G02B7/02 , G01N2021/178
Abstract: A resolution measurement apparatus includes a stage configured to receive a display module including an optical part. The stage includes an opening that overlaps the optical part, when viewed in a plan view, when the display module is disposed on the stage. The resolution measuring apparatus further includes a plurality of cameras disposed above the stage, a light source disposed under the stage and overlapping the opening when viewed in the plan view, and a lens disposed between the light source and the stage. The lens overlaps the opening when viewed in the plan view, and the optical part overlaps the lens, when viewed in the plan view, when the display module is disposed on the stage.
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公开(公告)号：US20250107424A1
公开(公告)日：2025-03-27
申请号：US18823514
申请日：2024-09-03
Applicant: Samsung Display Co., Ltd.
Inventor： Hyoungjun Ahn , Taehoon Park , Kyoungjin Seo , Jinwook Lee , Byunggyu Chae , Donghyuk Choi , Sangjin Han
IPC: H10K71/60 , H01L21/67 , H01L21/68 , H01L21/683 , H10K59/12
Abstract: Disclosed are an apparatus for and method of manufacturing a display device. The apparatus for manufacturing a display device includes a seating portion on which a substrate having a dummy layer thereon is seated, support portions on the seating portion to support the substrate, a measurement portion facing the seating portion, and configured to measure a thickness of the dummy layer, wherein the seating portion is configured to move linearly so that the measurement portion and the dummy layer are positioned at corresponding positions based on a result of detection by the measurement portion.
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公开(公告)号：US20220065742A1
公开(公告)日：2022-03-03
申请号：US17367785
申请日：2021-07-06
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor： SANGHUI PARK , Jinwook Lee
Abstract: A resolution measurement apparatus includes a stage configured to receive a display module including an optical part. The stage includes an opening that overlaps the optical part, when viewed in a plan view, when the display module is disposed on the stage. The resolution measuring apparatus further includes a plurality of cameras disposed above the stage, a light source disposed under the stage and overlapping the opening when viewed in the plan view, and a lens disposed between the light source and the stage. The lens overlaps the opening when viewed in the plan view, and the optical part overlaps the lens, when viewed in the plan view, when the display module is disposed on the stage.
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