AUTOMATED TESTING OF OPTICAL ASSEMBLIES
    1.
    发明公开

    公开(公告)号:US20240344926A1

    公开(公告)日:2024-10-17

    申请号:US18629571

    申请日:2024-04-08

    Applicant: IonQ, Inc.

    CPC classification number: G01M11/0207

    Abstract: The disclosure describes various aspects of different for automated testing of optical assemblies. A system is described that includes an arm (e.g., a motorized arm) configured to be positioned over an optical assembly having a base plate with multiple optical elements that form one or more optical beam paths. The system also includes at least one optical tool that is configured to be removably attached to the arm and has a measurement instrument to perform a specified test on at least one of the optical beam paths. The arm is configured to adjust its position over the optical assembly to move the optical tool to the correct place to perform the specified test. The system may also include an optical tool changer configured to hold the optical tool in a tool holder when not attached to the arm and to hold additional optical tools in respective tool holders.

    Resolution measurement apparatus and resolution measurement method using the same

    公开(公告)号:US12072259B2

    公开(公告)日:2024-08-27

    申请号:US17367785

    申请日:2021-07-06

    CPC classification number: G01M11/0207 G02B7/02 G01N2021/178

    Abstract: A resolution measurement apparatus includes a stage configured to receive a display module including an optical part. The stage includes an opening that overlaps the optical part, when viewed in a plan view, when the display module is disposed on the stage. The resolution measuring apparatus further includes a plurality of cameras disposed above the stage, a light source disposed under the stage and overlapping the opening when viewed in the plan view, and a lens disposed between the light source and the stage. The lens overlaps the opening when viewed in the plan view, and the optical part overlaps the lens, when viewed in the plan view, when the display module is disposed on the stage.

    DISPERSION MEASUREMENT DEVICE AND DISPERSION MEASUREMENT METHOD

    公开(公告)号:US20240192082A1

    公开(公告)日:2024-06-13

    申请号:US18286250

    申请日:2022-03-14

    CPC classification number: G01M11/0207

    Abstract: A dispersion measuring device includes a pulse forming unit, a light detection unit, a control unit, and an arithmetic operation unit. The control unit selectively outputs a first phase pattern and a second phase pattern. The pulse forming unit forms an optical pulse train from initial pulsed light, the optical pulse train including a plurality of optical pulses having a time difference from each other and having different center wavelengths from each other. The light detection unit detects a temporal waveform of the optical pulse train. The arithmetic operation unit estimates a wavelength dispersion amount of a measurement object based on a feature amount of the temporal waveform of the optical pulse train. When the first phase pattern is output, a pulse having a long center wavelength is generated first. When the second phase pattern is output, a pulse having a short center wavelength is generated first.

    Systems and methods for testing gratings

    公开(公告)号:US12007296B2

    公开(公告)日:2024-06-11

    申请号:US17304952

    申请日:2021-06-29

    Applicant: Google LLC

    Inventor: Timothy Bodiya

    CPC classification number: G01M11/0228 G01M11/0207 G01M11/35

    Abstract: Optical gratings, such as those used in waveguide displays, may have large aspect ratios. For example, a grating characteristic (e.g., period, feature size, etc.) can be much smaller than the grating area. Variations in the grating characteristic over the grating area may appear like a secondary grating having a long grating period superimposed on a primary grating for which the optical grating was designed. Because variations responsible for the secondary grating occur over a long distance relative to the primary grating period, it may be difficult to locate and characterize these variations with testing methods designed for shorter distances. The present disclosure presents systems and methods to detect and characterize the secondary gratings quickly and efficiently.

    METHOD TO MEASURE LIGHT LOSS OF OPTICAL FILMS AND OPTICAL SUBSTRATES

    公开(公告)号:US20240125670A1

    公开(公告)日:2024-04-18

    申请号:US18397977

    申请日:2023-12-27

    CPC classification number: G01M11/0285 G01M11/0207

    Abstract: A method of optical device metrology is provided. The method includes introducing a first type of light into a first optical device during a first time period, the first optical device including an optical substrate and an optical film disposed on the optical substrate, the first optical device further including a first surface, a second surface, and one or more sides connecting the first surface with the second surface; and measuring, during the first time period, a quantity of the first type of light transmitted from a plurality of locations on the first surface or the second surface during the first time period, wherein the measuring is performed by a detector coupled to one or more fiber heads positioned to collect the light transmitted from the plurality of locations.

    Blocker having light transmission and reflection device

    公开(公告)号:US11768390B2

    公开(公告)日:2023-09-26

    申请号:US17187294

    申请日:2021-02-26

    CPC classification number: G02C13/003 G01M11/025 G01M11/0207 G02B26/02

    Abstract: The blocker described comprises: a lens illumination light source; a light transmission and reflection device to reflect/transmit the light; an image sensor to detect light reflected by the light transmission and reflection device and thereby obtain an lens image; a lens meter to detect the light that has passed through the light transmission and reflection device to thereby measure lens characteristics; and a blocking member to attach a leap block to the lens. The light transmission and reflection device comprises: a first reflection plate having a central hole; a first rotating cylinder to be coupled to and to rotate the first reflection plate; a second rotating cylinder located inside and to rotate the first rotating cylinder; a second reflection plate, adjusted by the second rotating cylinder and configured to open or block the central hole in the first reflection plate; and driving means configured to drive the second rotating cylinder.

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