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公开(公告)号:US10723946B2
公开(公告)日:2020-07-28
申请号:US16157054
申请日:2018-10-10
发明人: Jonghee Park , Kitae Kim , Jinseock Kim , Beomsoo Kim , Sangtae Kim , Kyungbo Shim , Giyong Nam , Youngjin Yoon , Daesung Lim
摘要: An etchant includes: based on a total weight of the etchant, about 1 wt % to about 15 wt % of sulfurized peroxide, about 5 wt % to about 10 wt % of nitric acid, about 20 wt % to about 40 wt % of organic acid, about 0.05 wt % to about 5 wt % of ferric nitrate, about 0.1 wt % to about 5 wt % of ionic sequestrant, and 0.1 wt % to 5 wt % of corrosion inhibitor, wherein a remaining amount is deionized water.
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2.
公开(公告)号:US10465296B2
公开(公告)日:2019-11-05
申请号:US15005614
申请日:2016-01-25
发明人: Soomin An , Youngjun Kim , Hongsick Park , Inseol Kuk , Youngchul Park , Inho Yu , Seungsoo Lee , Jongmun Lee , Daesung Lim
IPC分类号: C23F1/18 , C23F1/26 , H01L27/12 , H01L21/3213 , H01L29/49
摘要: An etchant composition includes an etchant composition that includes about 0.5 wt % to about 20 wt % of persulfate, about 0.01 wt % to about 2 wt % of a fluorine compound, about 1 wt % to about 10 wt % of an inorganic acid, about 0.5 wt % to about 5 wt % of a cyclic amine compound, about 0.1 wt % to about 5 wt % of a chlorine compound, about 0.1 wt % to about 10 wt % of an aliphatic sulfonic acid, about 1 wt % to about 20 wt % of an organic acid or an organic acid salt, and water based on a total weight of the etchant composition.
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公开(公告)号:US11225721B2
公开(公告)日:2022-01-18
申请号:US16284629
申请日:2019-02-25
发明人: Jinhyung Kim , Joohwan Chung , Jinsook Kim , Haccheol Kim , Byungsu Lee , Changsoo Kim , Jungseek Jung , Dongki Kim , Sangtae Kim , Giyong Nam , Youngchul Park , Kyungbo Shim , Daesung Lim , Sanghoon Jang
IPC分类号: C23F1/30 , H01L21/3213 , C09K13/04 , C09K13/00 , H01L21/465 , C09K13/06 , H01L21/302 , H01L21/306 , H01L29/786 , C23F1/16
摘要: A thin film etchant composition for preventing re-adsorption of an etched metal and uniformly etching a thin film is provided. The thin film etchant composition includes about 43 wt % to about 46 wt % of phosphoric acid, about 5 wt % to about 8 wt % of nitric acid, about 10 wt % to about 17 wt % of acetic acid, about 1 wt % to about 3 wt % of iron nitrate, about 0.7 wt % to about 1.5 wt % of phosphate, and deionized water as a remaining amount based on a total weight of the thin film etchant composition.
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