公开(公告)号：US11183333B2

公开(公告)日：2021-11-23

申请号：US16864653

申请日：2020-05-01

Applicant: SAMSUNG ELECTRO-MECHANICS CO., LTD.

Inventor： Won Woo Cho ,  Jong Duck Kim ,  Jae Sun Won

IPC: H01G4/30 ,  H01G4/012 ,  H01G2/06 ,  H01G4/12 ,  H01G4/40

Abstract: A multilayer electronic component includes a body including dielectric layers, and first and second internal electrodes alternately stacked in a first direction, and having first and second surfaces opposing each other in the first direction, third and fourth surfaces connected to the first and second surfaces and opposing each other in a second direction, and fifth and sixth surfaces connected to the first to fourth surfaces and opposing each other in a third direction, a resistor disposed on the second surface, a via electrode exposed to the second surface and connecting the second internal electrode and the resistor to each other, a first external electrode disposed on the third surface and connected to the first internal electrode, and a second external electrode disposed on the fourth surface and connected to the resistor.

公开(公告)号：US11387041B2

公开(公告)日：2022-07-12

申请号：US16854216

申请日：2020-04-21

Applicant: SAMSUNG ELECTRO-MECHANICS CO., LTD.

Inventor： Jae Sun Won ,  Jong Duck Kim ,  Hae Suk Chung ,  Jae Joon Yu ,  Won Woo Cho ,  Ki Hong Kim

IPC: H01G4/008 ,  H01G4/30 ,  H01G4/40 ,  H01G4/232 ,  H01G4/248

Abstract: By controlling shapes of internal electrodes, when short-circuit occurs between the internal electrodes, a short-circuited portion may be opened by an overcurrent, to serve as a fuse. Also, by controlling shapes of internal electrodes, equivalent series inductance (ESL) at a high frequency may be reduced.

公开(公告)号：US20140189626A1

公开(公告)日：2014-07-03

申请号：US14143706

申请日：2013-12-30

Applicant: SAMSUNG ELECTRO-MECHANICS CO., LTD.

Inventor： Jung Kyung SUNG ,  Bong Wan Koo ,  Won Woo Cho

IPC: G06F17/50

CPC classification number: G06F17/5081

Abstract: The present invention relates to a circuit width thinning defect prevention device and a method of preventing a circuit width thinning defect, and can prevent a circuit width thinning defect, that is, a reduction in circuit width due to excessive etching on a specific portion by including a storage means for storing dam design information classified according to the type of a weak portion; an analysis means for analyzing first design information to deduce the type and position of the weak portion; a matching means for extracting the dam design information corresponding to the type of the weak portion from the dam design information stored in the storage means; and a change means for changing the first design information to add a dam according to the dam design information extracted by the matching means to the position of the weak portion deduced by the analysis means.

Abstract translation: 本发明涉及一种电路宽度减薄缺陷防止装置及防止电路宽度变薄缺陷的方法，能够防止电路宽度变薄的缺陷，即由于特定部分的过度蚀刻引起的电路宽度的下降，包括 存储装置，用于存储根据弱部分的类型分类的大坝设计信息; 分析装置，用于分析第一设计信息以推断弱部分的类型和位置; 用于从存储在存储装置中的大坝设计信息中提取与弱部分的类型对应的大坝设计信息的匹配装置; 以及改变装置，用于根据由匹配装置提取的大坝设计信息改变到由分析装置推断的弱部分的位置来改变第一设计信息以添加坝。