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公开(公告)号：US20210262932A1
公开(公告)日：2021-08-26
申请号：US17123336
申请日：2020-12-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Alexey Grigorievich Anikanov , Tatiana Igorevna Kopysova , Pavel Aleksandrovich Ivshin , Alexey Dmitrievich Lantsov , Vasily Victorovich Grigorev , Maxim Vladimirovich Ryabko
IPC: G01N21/47
Abstract: A system for extraction of optical properties of a turbid medium by using diffuse reflectometry may include at least one light source, an optical receiver, at least one separator, and at least one processor configured to control the optical receiver, while the radiation is provided to the turbid medium in the radiation input area of the at least one light source, to sequentially open each LC cell from the array of LC cells, and simultaneously receive radiation, passed through the sequentially opened LC cells and corresponding microlenses, by corresponding photodetectors from the array of photodetectors to obtain the distribution of radiation intensity; and extract the optical properties of the turbid medium based on the distribution of radiation intensity.
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公开(公告)号：US10405806B2
公开(公告)日：2019-09-10
申请号：US14961145
申请日：2015-12-07
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Chanwook Baik , Jisoo Kyoung , Maxim Vladimirovich Riabko , Youngzoon Yoon , Alexey Dmitrievich Lantsov , Younggeun Roh , Jaesoong Lee
IPC: A61B5/00 , A61B5/021 , A61B5/024 , A61B5/1455
Abstract: An apparatus for and a method of measuring blood pressure are provided. The apparatus includes a sensor configured to radiate light to a body part, and detect a light signal that is changed due to the body part. The apparatus further includes a signal processor configured to determine a bio signal based on the light signal; and a central processing unit configured to determine a blood pressure based on the bio signal and a blood pressure estimation algorithm.
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公开(公告)号：US11353398B2
公开(公告)日：2022-06-07
申请号：US17123336
申请日：2020-12-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Alexey Grigorievich Anikanov , Tatiana Igorevna Kopysova , Pavel Aleksandrovich Ivshin , Alexey Dmitrievich Lantsov , Vasily Victorovich Grigorev , Maxim Vladimirovich Ryabko
IPC: G01N21/47
Abstract: A system for extraction of optical properties of a turbid medium by using diffuse reflectometry may include at least one light source, an optical receiver, at least one separator, and at least one processor configured to control the optical receiver, while the radiation is provided to the turbid medium in the radiation input area of the at least one light source, to sequentially open each LC cell from the array of LC cells, and simultaneously receive radiation, passed through the sequentially opened LC cells and corresponding microlenses, by corresponding photodetectors from the array of photodetectors to obtain the distribution of radiation intensity; and extract the optical properties of the turbid medium based on the distribution of radiation intensity.
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4.发明授权公开(公告)号：US11045103B2
公开(公告)日：2021-06-29
申请号：US15581695
申请日：2017-04-28
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Alexey Andreevich Shchekin , Maxim Vladimirovich Riabko , Anton Sergeevich Medvedev , Alexey Dmitrievich Lantsov , Sergey Nikolaevich Koptyaev
IPC: A61B5/026 , A61B5/1455 , A61B5/00 , A61B5/024
Abstract: Physiological parameter detecting apparatuses and methods of detecting the physiological parameters are provided. A physiological parameter detecting apparatus includes: a light source configured to emit a light onto a region of an object; an optical path converter configured to receive the light returning from the object and convert an optical path of the received light; an optical detector configured to detect the light that has the converted optical path; and a controller configured to extract physiological information of the object from the detected light.
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Patent Agency Ranking
公开(公告)号：US10296776B2
公开(公告)日：2019-05-21
申请号：US15444568
申请日：2017-02-28
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Alexey Dmitrievich Lantsov , Alexey Andreevich Shchekin , Maksim Vladimirovich Riabko , Anton Sergeevich Medvedev , Sergey Nikolaevich Koptyaev
Abstract: A biometrics authentication apparatus and a biometrics authentication method are disclosed. The biometrics authentication apparatus includes: a light source configured to emit a light; a modulator configured to change a spatial distribution of the light that is scattered and reflected from a region of interest of a user; a detector configured to detect an integral power of the light that is scattered from the region of interest; and a processor configured to obtain a measurement signal based on the integral power of the light, compare the measurement signal with a reference signal stored in a memory, and determine whether to authenticate the user based on a degree of match between the measurement signal and the reference signal.
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公开(公告)号：US10224688B2
公开(公告)日：2019-03-05
申请号：US15870322
申请日：2018-01-12
Applicant: SAMSUNG ELECTRONICS CO., LTD. , INTERNATIONAL CENTER FOR QUANTUM OPTICS & QUANTUM TECHNOLOGIES LIMITED LIABILITY COMPANY
Inventor： Sergey Nikolaevich Koptyaev , Grigoriy Vasil'evich Lihachev , Nikolay Genad'evich Pavlov , Alexey Andreevich Shchekin , Igor Antonovich Bilenko , Maxim Vladimirovich Riabko , Mikhael Leonidovich Gorodetsky , Stanislav Vladimirovich Polonsky , Andrey Sergeevich Voloshin , Alexey Dmitrievich Lantsov , Anton Sergeevich Medvedev , Valery Evgenievich Lobanov
Abstract: Provided is an optical source apparatus that may generate two different optical frequency combs. The optical source apparatus includes an optical resonator and a continuous wave laser emitting laser light having a spectrum component corresponding to a resonance frequency of the optical resonator, and the optical resonator is configured to generate a first frequency comb and a second frequency comb having different modes by interacting with the laser light emitted by the continuous wave laser.
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公开(公告)号：US10206576B2
公开(公告)日：2019-02-19
申请号：US14849915
申请日：2015-09-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Abstract: The laser speckle interferometric system includes a memory for storing a measurement result of a correction parameter and models for matching a result of processing the speckle pattern to the parameters of the object and a processor for stabilizing the speckle pattern detected by controlling a condition for detecting the speckle pattern in real time, processing a time-varying function representing a temporal change in the speckle pattern based on the speckle pattern and the parameters and generating data indicating tested parameters.
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公开(公告)号：US09400254B2
公开(公告)日：2016-07-26
申请号：US14669536
申请日：2015-03-26
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Alexander Viacheslavovich Shcherbakov , Maxim Vladimirovich Riabko , Alexey Dmitrievich Lantsov
IPC: G01N21/956 , G01B11/02 , G01N21/93 , G03F7/20 , H01L21/66
CPC classification number: G01N21/956 , G01B11/02 , G01B2210/56 , G01N21/93 , G03F7/70625 , H01L22/12 , Y10S977/88
Abstract: Provided are a method and device for measuring a critical dimension of a nanostructure. The method includes acquiring a reference intensity distribution, in each of a number of spectral bands, of light scattered by at least one reference nanostructure, for each of a number at different positions of the at least one reference nano structure disposed along an optical axis; generating a library of reference intensity distribution arrays based on a number of the reference intensity distributions, determining an intensity distribution of light scattered by a nanostructure under investigation, for each of the number of spectral bands, at each of the number of different positions of the nanostructure under investigation disposed along the optical axis; generating an intensity distribution array by using the determined intensity distributions, and determining information about a critical dimension of the nanostructure under investigation by comparing the intensity distribution array with the library of reference intensity distribution arrays.
Abstract translation: 提供了一种用于测量纳米结构的临界尺寸的方法和装置。 该方法包括在沿着光轴布置的至少一个参考纳米结构的不同位置处的数量中的每一个处获取在多个光谱带中的每一个中由至少一个参考纳米结构散射的光的参考强度分布; 基于多个参考强度分布生成参考强度分布阵列库，确定由所研究的纳米结构散射的光的光强分布，对于每个数量的光谱带，在每个所述多个光谱带的不同位置的数量 正在研究的纳米结构沿着光轴布置; 通过使用确定的强度分布来产生强度分布阵列，并且通过将强度分布阵列与参考强度分布阵列的库进行比较来确定关于正在研究的纳米结构的临界尺寸的信息。
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公开(公告)号：US09322640B2
公开(公告)日：2016-04-26
申请号：US13961305
申请日：2013-08-07
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sergey Nikolaevich Koptyaev , Maxim Vladimirovich Ryabko , Alexander Vyacheslavovich Shcherbakov , Alexey Dmitrievich Lantsov
IPC: G01B11/02
CPC classification number: G01B11/02 , G01B2210/56
Abstract: Optical measuring systems for measuring geometrical parameters of nano-objects and methods of measuring a critical size (CS) are provided. The optical method of measuring the CS includes selecting parameters of an optic scheme and an illumination condition; recording a set of nanostructure images corresponding to various wavelengths with various defocusing levels of scattered radiation; calculating a plurality of sets of images of a nanostructure with various defocusing levels, corresponding to various wavelengths of the scattered radiation with CS values within a known range; and comparing a set of measured images of the nanostructure with the sets of the calculated images and determining a best approximate value of the CS values.
Abstract translation: 提供了用于测量纳米物体几何参数的光学测量系统和测量临界尺寸（CS）的方法。 测量CS的光学方法包括选择光学方案的参数和照明条件; 记录对应于各种波长的一组纳米结构图像，其具有各种散焦辐射的散焦水平; 计算具有各种散焦水平的纳米结构的多组图像，对应于具有CS值在已知范围内的散射辐射的各种波长; 以及将纳米结构的一组测量图像与所计算的图像的集合进行比较，并确定CS值的最佳近似值。
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