公开(公告)号：US20220029090A1

公开(公告)日：2022-01-27

申请号：US17386187

申请日：2021-07-27

Applicant: Samsung Electronics Co., Ltd. ,  POSTECH Research and Business Development Foundation

Inventor： Won Joon CHO ,  Sungdug KIM ,  Inseob SHIN ,  Gilho LEE ,  Seong JANG

IPC: H01L43/04 ,  H01L27/22 ,  H01L43/06 ,  H01L43/10

Abstract: The present disclosure provides a spin-orbit torque structure having a high spin Hall angle and low resistance by including a topological material. In addition, the present disclosure provides a spin-orbit torque structure having a low power consumption density by including a topological material. Also, a magnetic memory device including the spin-orbit torque structure is provided.

公开(公告)号：US20240237558A9

公开(公告)日：2024-07-11

申请号：US18194539

申请日：2023-03-31

Applicant: Samsung Electronics Co., Ltd. ,  POSTECH Research and Business Development Foundation

Inventor： Jaehyeong LEE ,  Gilho LEE ,  Jinhyoun KANG ,  Jaeho SHIN ,  Seunghan LEE ,  Daeseok HAN

IPC: H10N69/00

CPC classification number: H10N69/00

Abstract: A superconducting quantum interferometric device (SQUID) includes: a conductive material region formed on a partial region of a substrate; a first superconducting material layer including a first loop including first and second extension units that are spaced apart from each other to form a proximity Josephson junction and that form a stack structure with the conductive material region; a second superconducting material layer including a second loop including first and second end units spaced apart from each other; and a tunnel Josephson junction formed by a stack structure including a tunnel thin film layer forming and the first and second end units, wherein at least a portion of the second loop forms a stack structure with the first loop.

公开(公告)号：US20240138271A1

公开(公告)日：2024-04-25

申请号：US18194539

申请日：2023-03-30

Applicant: Samsung Electronics Co., Ltd. ,  POSTECH Research and Business Development Foundation

Inventor： Jaehyeong LEE ,  Gilho LEE ,  Jinhyoun KANG ,  Jaeho SHIN ,  Seunghan LEE ,  Daeseok HAN

IPC: H10N69/00

CPC classification number: H10N69/00

Abstract: A superconducting quantum interferometric device (SQUID) includes: a conductive material region formed on a partial region of a substrate; a first superconducting material layer including a first loop including first and second extension units that are spaced apart from each other to form a proximity Josephson junction and that form a stack structure with the conductive material region; a second superconducting material layer including a second loop including first and second end units spaced apart from each other; and a tunnel Josephson junction formed by a stack structure including a tunnel thin film layer forming and the first and second end units, wherein at least a portion of the second loop forms a stack structure with the first loop.

公开(公告)号：US20230085539A1

公开(公告)日：2023-03-16

申请号：US17939664

申请日：2022-09-07

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Gilho LEE ,  Sichen JIN ,  Sungsoo KIM ,  Jungin LEE ,  Seokyeong JUNG

IPC: G10L15/197 ,  G10L15/02 ,  G10L15/30 ,  G10L15/22

Abstract: According to various example embodiments, an electronic device includes a microphone configured to receive an audio signal including speech of a user, a processor, and a memory configured to store instructions executable by the processor and personal information of the user, in which the processor is configured to extract a plurality of speech recognition candidates by analyzing a feature of the speech of the user, extract a keyword based on the plurality of speech recognition candidates, search for replacement data, based on the keyword and the personal information, and generate a recognition result corresponding to the speech of the user, based on the replacement data.

公开(公告)号：US20200271715A1

公开(公告)日：2020-08-27

申请号：US16561741

申请日：2019-09-05

Applicant: Samsung Electronics Co., Ltd.

Inventor： Seon-Mi LEE ,  Sung Jin KIM ,  Ja-Hwan KU ,  Jae-Hyun KIM ,  Gilho LEE ,  Dahm YU ,  Jonghyun LIM

IPC: G01R31/26

Abstract: Disclosed are a test chamber and a test apparatus having the same. The test chamber includes a test compartment configured to support a plurality of test boards, each being configured to secure a test object. The test chamber applies a test signal to the test object. The test chamber includes an inlet side and a discharge side, and a supply duct vertically extending along a height of the test compartment. The supply duct supplies the inlet side of the test compartment with the test fluid. The test chamber includes a fluid controller to uniformly control a distribution of a test fluid in the supply duct and uniformly supply the test compartment with the test fluid. The disclosed test chamber and test apparatus provide a uniform test temperature and thereby improve a test reliability of a test object such as a semiconductor or semiconductor package.