公开(公告)号：US20240248850A1

公开(公告)日：2024-07-25

申请号：US18416558

申请日：2024-01-18

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： DAEHYUN KIM ,  SEONGMUK KANG ,  JIHO KIM ,  KYOMIN SOHN ,  YEONGGEOL SONG ,  KIJUN LEE ,  MYUNGKYU LEE ,  SUKHAN LEE

IPC: G06F12/0891 ,  G06F12/126

CPC classification number: G06F12/0891 ,  G06F12/126

Abstract: A memory system includes a system controller and a memory device. The system controller includes a memory controller configured to transmit a received address to a decoding module, and output, to the host device, decoded data. The decoding module includes a cache device and a decoder. The decoding module is configured to receive the data corresponding to the address from the memory device. The decoding module is configured transmit the data stored in the cache device to the memory controller in response to determining that the data corresponding to the address is stored in the cache device. The decoding module is configured to decode the data corresponding to the address to generate decoded data and store the decoded result in the cache device in response to determining that the data corresponding to the address is not stored in the cache device.

公开(公告)号：US20230023762A1

公开(公告)日：2023-01-26

申请号：US17719722

申请日：2022-04-13

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： JIHO KIM ,  MINHYEOK KWON ,  SHIGENOBU MAEDA ,  JOOYEOK SEO ,  MINUK LEE

IPC: H01L21/67 ,  G05B19/418

Abstract: The program code, when executed by a processor, causes the processor to input fabrication data including a plurality of parameters associated with a semiconductor fabricating process to a framework to generate a first class for analyzing the fabrication data, to extract a first parameter targeted for analysis and a second parameter associated with the first parameter from the plurality of parameters and generate a second class for analyzing the first parameter as a sub class of the first class, to modify the first parameter and the second parameter into a data structure having a format appropriate to store in the second class, so as to be stored in the second class, to perform data analysis on the first parameter and the second parameter, to transform the first parameter and the second parameter into corresponding tensor data, and to input the tensor data to the machine learning model.