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    SPECTRAL FILTER, AND IMAGE SENSOR AND ELECTRONIC DEVICE INCLUDING THE SPECTRAL FILTER
    3.
    发明申请
    SPECTRAL FILTER, AND IMAGE SENSOR AND ELECTRONIC DEVICE INCLUDING THE SPECTRAL FILTER 有权

    公开(公告)号：US20220128407A1

    公开(公告)日：2022-04-28

    申请号：US17506293

    申请日：2021-10-20

    Applicant: SAMSUNG ELECTRONICS CO, LTD.

    Inventor： Jaesoong LEE ,  Hyochul KIM ,  Yeonsang PARK

    IPC: G01J3/26 ,  G01J3/18 ,  G01J3/28

    Abstract: Provided is a spectral filter including a first Bragg reflective layer, a second Bragg reflective layer that is spaced apart from the first Bragg reflective layer and includes a cavity, the first resonance layer being provided between the first Bragg reflective layer and the second Bragg reflective layer, a second resonance layer including at least a portion of the first Bragg reflective layer, the second Bragg reflective layer, and the cavity, a third Bragg reflective layer, a fourth Bragg reflective layer spaced apart from the third Bragg reflective layer, wherein the second resonance layer is provided between the third Bragg reflective layer and the fourth Bragg reflective layer.

    POLARIZATION SPECTRAL FILTER, POLARIZATION SPECTRAL FILTER ARRAY, AND POLARIZATION SPECTRAL SENSOR
    4.
    发明申请
    POLARIZATION SPECTRAL FILTER, POLARIZATION SPECTRAL FILTER ARRAY, AND POLARIZATION SPECTRAL SENSOR 有权

    公开(公告)号：US20210191141A1

    公开(公告)日：2021-06-24

    申请号：US17095477

    申请日：2020-11-11

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Yeonsang PARK ,  Hyochul KIM ,  Jaesoong LEE ,  Younggeun ROH

    IPC: G02B27/28 ,  G02B5/20 ,  G02B5/28 ,  G01J4/04

    Abstract: Provided is a polarization spectral filter, including: a first reflector and a second reflector disposed to face each other in a first direction; and a grating layer disposed between the first reflector and the second reflector. The grating layer includes a plurality of first grating elements and a plurality of second grating elements, the plurality of first grating elements and the plurality of second grating elements being alternately arranged in a second direction perpendicular to the first direction. The plurality of first grating elements include a first dielectric material having a first refractive index. The plurality of second grating elements include a second dielectric material having a second refractive index different from the first refractive index.

    MICRO-SCALE WAVEGUIDE SPECTROSCOPE
    6.
    发明申请
    MICRO-SCALE WAVEGUIDE SPECTROSCOPE 审中-公开

    公开(公告)号：US20190170579A1

    公开(公告)日：2019-06-06

    申请号：US16043895

    申请日：2018-07-24

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Jaesoong LEE

    IPC: G01J3/28 ,  G01J3/02 ,  G01J3/26 ,  G02B6/02 ,  G02B6/12

    Abstract: A Micro-scale waveguide spectroscope is provided. The waveguide spectroscope includes a waveguide having a bent region that does not satisfy a total reflection condition, and a light detector arranged on the bent region of the waveguide and configured to detect light emitted from the bent region. The waveguide includes a single layer having a refractive index greater than that of air or includes a core layer and a cladding layer surrounding the core layer. The waveguide has at least a first region having a first radius of curvature and a second region having a second radius of curvature different from the first radius of curvature.

    OPTICAL FILTER AND SPECTROMETER INCLUDING THE OPTICAL FILTER
    9.
    发明申请
    OPTICAL FILTER AND SPECTROMETER INCLUDING THE OPTICAL FILTER 有权

    公开(公告)号：US20210148755A1

    公开(公告)日：2021-05-20

    申请号：US16952512

    申请日：2020-11-19

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Jaesoong LEE ,  Yeonsang PARK ,  Hyochul KIM

    IPC: G01J3/02 ,  G02B5/22

    Abstract: The disclosure provides an optical filter element including a plurality of nano-columns separated from each other in a horizontal direction and extended in a vertical direction, and each of the plurality of nano-columns includes a first material layer having an first extinction coefficient and second material layers having second extinction coefficients different from the first extinction coefficient of the first material layer and a spectrometer including the same.

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