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公开(公告)号:US11239385B2
公开(公告)日:2022-02-01
申请号:US16844616
申请日:2020-04-09
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jeonghwan Jang , Jae-Yoon Kim , Sungwon Ko , Junghee Kwak , Sangseok Lee , Suyeol Lee , Seungwan Chae , Pun Jae Choi
Abstract: A light emitting device is provided. The light emitting device includes a first semiconductor layer; a second semiconductor layer provided on a bottom surface of the first semiconductor layer; an active layer interposed between the first semiconductor layer and the second semiconductor layer; a dielectric layer provided on a bottom surface of the second semiconductor layer; a plurality of first n-contacts provided on a first etched surface of the first semiconductor layer; and a plurality of first p-contacts and a plurality of second p-contacts provided on the bottom surface of the second semiconductor layer. One first n-contact is disposed along a first edge region of the first semiconductor layer, one first p-contact is closer to the one first n-contact than one second p-contact, and an area of the one first p-contact is greater than an area of each of the second p-contacts.
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公开(公告)号:US11658259B2
公开(公告)日:2023-05-23
申请号:US17589192
申请日:2022-01-31
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jeonghwan Jang , Jae-Yoon Kim , Sungwon Ko , Junghee Kwak , Sangseok Lee , Suyeol Lee , Seungwan Chae , Pun Jae Choi
CPC classification number: H01L33/0016 , H01L33/24 , H01L33/405 , H01L33/62
Abstract: A light emitting device is provided. The light emitting device includes a first semiconductor layer; a second semiconductor layer provided on a bottom surface of the first semiconductor layer; an active layer interposed between the first semiconductor layer and the second semiconductor layer; a dielectric layer provided on a bottom surface of the second semiconductor layer; a plurality of first n-contacts provided on a first etched surface of the first semiconductor layer; and a plurality of first p-contacts and a plurality of second p-contacts provided on the bottom surface of the second semiconductor layer. One first n-contact is disposed along a first edge region of the first semiconductor layer, one first p-contact is closer to the one first n-contact than one second p-contact, and an area of the one first p-contact is greater than an area of each of the second p-contacts.
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