WAFER CHUCK APPARATUS WITH AIR MEMBER AND METHOD OF FABRICATING A SEMICONDUCTOR DEVICE USING THE SAME

    公开(公告)号:US20240063044A1

    公开(公告)日:2024-02-22

    申请号:US18202892

    申请日:2023-05-27

    CPC classification number: H01L21/68 H01L21/6838 H01L21/68757 H01L21/68785

    Abstract: A method of fabricating a semiconductor device comprises mounting a carrier substrate and a wafer on a wafer chuck of a wafer chuck apparatus, the carrier substrate and the wafer attached to each other, injecting air into an air member by selectively controlling at least one air injection pipe connected to the air member of the wafer chuck apparatus, tilting the wafer chuck to a predetermined angle in response to the air being injected into the air member, processing the wafer while the wafer chuck is tilted, determining whether to change a tilt angle of the wafer chuck or a position of the wafer, adjusting an amount of air injected into the air member according to a changed tilt angle of the wafer chuck or a changed position of the wafer, and processing the wafer after adjusting of the amount of air in the air member.

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