公开(公告)号：US09612276B2

公开(公告)日：2017-04-04

申请号：US14299058

申请日：2014-06-09

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jong-Woon Yoo ,  Sang-Kyeong Han ,  Ung-Jin Jang ,  Ki-Jae Song

IPC: G01R31/10 ,  G01R31/28

CPC classification number: G01R31/2879

Abstract: A test device includes a test unit and a voltage selection circuit. The test unit is configured to detect a voltage at a test pad of a semiconductor device under test by applying a test current to the test pad. The voltage selection circuit is configured to apply a selection voltage to a ground pad of the semiconductor device under test by selecting one of a plurality of voltages according to a test mode.

公开(公告)号：US20130342236A1

公开(公告)日：2013-12-26

申请号：US13804149

申请日：2013-03-14

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Ki-Jae Song ,  Jong-Woon Yoo ,  Sang-Kyeong Han ,  Gil-Beag Kim

IPC: G01R1/04

CPC classification number: G01R1/0408 ,  G01R31/31926

Abstract: A test interface board comprises at least one switch matrix including a plurality of switching elements that connect a plurality of connection nodes to each other. The at least one switch matrix is configured to connect a plurality of channels of an automatic test equipment (ATE) to respective pin positions corresponding to a device under test (DUT) in response to switching control signals. The plurality of channels provide test operation signals for testing the DUT. A control logic is configured to generate the switching control signals based on pin configuration information of the DUT.

Abstract translation: 测试接口板包括至少一个开关矩阵，其包括将多个连接节点彼此连接的多个开关元件。 至少一个开关矩阵被配置为响应于开关控制信号将自动测试设备（ATE）的多个通道连接到对应于被测器件（DUT）的相应引脚位置。 多个通道提供用于测试DUT的测试操作信号。 控制逻辑被配置为基于DUT的引脚配置信息生成开关控制信号。