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    RECHARGEABLE POWER MODULE AND TEST SYSTEM INCLUDING THE SAME
    5.
    发明申请
    RECHARGEABLE POWER MODULE AND TEST SYSTEM INCLUDING THE SAME 有权
    可充电的电源模块和测试系统，包括它们

    公开(公告)号：US20160131709A1

    公开(公告)日：2016-05-12

    申请号：US14728333

    申请日：2015-06-02

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Jong-Woon Yoo ,  Ki-Jae Song ,  Soo-Yong Park

    IPC: G01R31/317 ,  G01R31/28 ,  H02J7/00

    CPC classification number: G01R31/31721 ,  G01R31/2834 ,  G01R31/31924 ,  H02J7/0047 ,  H02J7/008 ,  H02J2007/005

    Abstract: A rechargeable power module (RPM) may include a rechargeable energy storage device such as a battery or capacitor, a charging circuit, a direct-current (DC) to DC converter, a low drop-out (LDO) voltage regulator and a controller. The charging circuit provides the rechargeable energy storage device with a charging current based on power requirements of device under test and the state of charge, or storage, of the energy storage device.

    Abstract translation: 可再充电电源模块（RPM）可以包括诸如电池或电容器的充电能量存储装置，充电电路，直流（DC）到DC转换器，低压降（LDO）电压调节器和控制器。 充电电路为可再充电能量存储装置提供基于能量存储装置的充电状态或存储状态的充电电流。

    TEST INTERFACE BOARDS AND TEST SYSTEMS
    6.
    发明申请
    TEST INTERFACE BOARDS AND TEST SYSTEMS 审中-公开
    测试接口板和测试系统

    公开(公告)号：US20130342236A1

    公开(公告)日：2013-12-26

    申请号：US13804149

    申请日：2013-03-14

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Ki-Jae Song ,  Jong-Woon Yoo ,  Sang-Kyeong Han ,  Gil-Beag Kim

    IPC: G01R1/04

    CPC classification number: G01R1/0408 ,  G01R31/31926

    Abstract: A test interface board comprises at least one switch matrix including a plurality of switching elements that connect a plurality of connection nodes to each other. The at least one switch matrix is configured to connect a plurality of channels of an automatic test equipment (ATE) to respective pin positions corresponding to a device under test (DUT) in response to switching control signals. The plurality of channels provide test operation signals for testing the DUT. A control logic is configured to generate the switching control signals based on pin configuration information of the DUT.

    Abstract translation: 测试接口板包括至少一个开关矩阵，其包括将多个连接节点彼此连接的多个开关元件。 至少一个开关矩阵被配置为响应于开关控制信号将自动测试设备（ATE）的多个通道连接到对应于被测器件（DUT）的相应引脚位置。 多个通道提供用于测试DUT的测试操作信号。 控制逻辑被配置为基于DUT的引脚配置信息生成开关控制信号。

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