专利检索 ap:("SAMSUNG ELECTRONICS CO., LTD.") AND inv:"Woojin Seo" 第 1 页

1.

发明公开
METHOD OF ANALYZING ELECTROSTATIC DISCHARGE NETWORK USING COMMON RESISTANCE REMOVAL, SYSTEM PERFORMING THE SAME AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME 审中-公开

公开(公告)号：US20240193339A1

公开(公告)日：2024-06-13

申请号：US18532496

申请日：2023-12-07

申请人： SAMSUNG ELECTRONICS CO., LTD.

发明人： Jordan Timothy Davis , Woojin Seo , Chanhee Jeon

IPC分类号： G06F30/392 , G06F30/327 , G06F30/394

CPC分类号： G06F30/392 , G06F30/327 , G06F30/394 , G06F2115/06

摘要： In an example method of analyzing an electrostatic discharge (ESD) network, input data characterizing a semiconductor device is received. The semiconductor device includes an input/output (I/O) pad, an ESD protection circuit, and at least one functional circuit. A common resistance of the ESD protection circuit is calculated based on the input data and using a plurality of resistances and at least one predetermined equation. The plurality of resistances are associated with the I/O pad, the ESD protection circuit, and the at least one functional circuit. A network analysis is performed on the semiconductor device by excluding the common resistance.