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公开(公告)号:US20220199150A1
公开(公告)日:2022-06-23
申请号:US17529900
申请日:2021-11-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Saemi SONG , Dokyun KIM , Yeonkyu CHOI , Doohee HWANG
IPC: G11C11/406
Abstract: Provided are a memory device and a method of refreshing the memory device regardless of a refresh rate multiplier for a temperature. In response to a refresh command at each base refresh rate (tREFi) based on a measured temperature, a memory device refreshes M memory cell rows at room temperature, refreshes 2M memory cell rows at a high temperature, and refreshes (½)M memory cell rows at a low temperature. The memory device refreshes (n+1)*M memory cell rows at a base refresh rate tREFi in response to a refresh command applied after n skipped base refresh rates, and refreshes (n+1)*M memory cell rows at a base refresh rate tREFi in response to a pulling-in refresh command.
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公开(公告)号:US20220068318A1
公开(公告)日:2022-03-03
申请号:US17215914
申请日:2021-03-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sangyun KIM , Kyungryun KIM , Junghwan PARK , Yeonkyu CHOI
Abstract: A memory device includes: a first circuit; a second circuit; and an adaptive body bias generator configured to receive frequency detection information or temperature detection information, to apply a first forward body bias or a first reverse body bias to the first circuit in response to the frequency detection information or the temperature detection information, and to apply a second forward body bias or a second reverse body bias to the second circuit in response to the frequency detection information or the temperature detection information.
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3.
公开(公告)号:US20230088490A1
公开(公告)日:2023-03-23
申请号:US18071054
申请日:2022-11-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Youngbin LEE , Kiho KIM , Jinhoon JANG , Yeonkyu CHOI
Abstract: Provided are an apparatus, a memory device, and a method for storing a plurality of parameter codes for an operation parameter. The memory device includes a mode register and a control logic circuit. To set a first operating condition and a second operating condition for one operation parameter, the mode register stores a first parameter code for the operation parameter and a second parameter code, which is expressed as an offset value from the first parameter code. The control logic circuit sets the first operating condition as a current operating condition of the memory device by using the first parameter code based on a first control code and sets the second operating condition as the current operating condition of the memory device by using the first parameter code and the second parameter code based on a second control code.
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4.
公开(公告)号:US20220157373A1
公开(公告)日:2022-05-19
申请号:US17399402
申请日:2021-08-11
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yeonkyu CHOI , Dokyun KIM , Seongjin LEE , Doohee HWANG
IPC: G11C11/406 , G11C7/10
Abstract: A memory system includes a memory controller and a memory device. The memory controller generates refresh commands periodically by an average refresh interval. The memory device performs a normal refresh operation and a hammer refresh operation during a refresh cycle time. The memory device includes a memory cell array including memory cells connected to a plurality of wordlines, a temperature sensor configured to provide temperature information by measuring an operation temperature of the memory cell array and a refresh controller configured to control the normal refresh operation and the hammer refresh operation. The refresh controller varies a hammer ratio of a unit hammer execution number of the hammer refresh operation executed during the refresh cycle time with respect to a unit normal execution number of the normal refresh operation executed during the refresh cycle time.
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5.
公开(公告)号:US20220148631A1
公开(公告)日:2022-05-12
申请号:US17466754
申请日:2021-09-03
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Youngbin LEE , Kiho KIM , Jinhoon JANG , Yeonkyu CHOI
Abstract: Provided are an apparatus, a memory device, and a method for storing a plurality of parameter codes for an operation parameter. The memory device includes a mode register and a control logic circuit. To set a first operating condition and a second operating condition for one operation parameter, the mode register stores a first parameter code for the operation parameter and a second parameter code, which is expressed as an offset value from the first parameter code. The control logic circuit sets the first operating condition as a current operating condition of the memory device by using the first parameter code based on a first control code and sets the second operating condition as the current operating condition of the memory device by using the first parameter code and the second parameter code based on a second control code.
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