公开(公告)号：US10338134B2

公开(公告)日：2019-07-02

申请号：US15333699

申请日：2016-10-25

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Min-Chul Jun ,  Yun-Bo Yang ,  Dong-Ho Lee ,  Tae-Hwan Oh ,  Dong-Han Yoon

IPC: G01R31/28 ,  H05K1/11 ,  H05K1/02 ,  H05K1/18 ,  H01L25/07 ,  G01R31/3185

Abstract: In an interface board for testing a multichip package, the multichip package includes a first type semiconductor chip and a second type semiconductor chip, the interface board includes a first surface facing the multichip package and a second surface facing a test apparatus, the first surface includes upper terminals that are electrically connected to terminals of the multichip package, the second surface includes lower terminals that are electrically connected to the test apparatus, and the upper terminals include a first upper terminal group for testing the first type semiconductor chip and a second upper terminal group for testing whether a crack defect exists in the second type semiconductor chip.

公开(公告)号：US09183950B2

公开(公告)日：2015-11-10

申请号：US14289078

申请日：2014-05-28

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yun-Bo Yang ,  Young-Jae Jung ,  Kui-Hyun Ro ,  Sung-Eun Yun

IPC: G11C29/16 ,  G11C29/48 ,  G11C29/04 ,  G06F11/27 ,  G11C29/12

CPC classification number: G11C29/12 ,  G06F11/27 ,  G11C29/16 ,  G11C29/48 ,  G11C2029/0401

Abstract: A memory card includes a memory cell, a connector, a controller, and firmware. The memory cell can switch between a plurality of states. The connector can be connected to an external device and exchange signals including commands and data with the external device. The controller exchanges signals with the connector, analyzes a received signal, and accesses the memory cell to record, retrieve or modify data based on the analysis result. The firmware is located within the controller, controls the operation of the controller, and can be set to a test mode or a user mode. When the firmware receives a test command from the external device and the firmware is set to the test mode, the firmware performs a defect test on the memory cell and transmits the result of the defect test to the external device through the connector.

Abstract translation: 存储卡包括存储单元，连接器，控制器和固件。 存储单元可以在多个状态之间切换。 连接器可以连接到外部设备，并与外部设备交换包括命令和数据的信号。 控制器与连接器交换信号，分析接收到的信号，并根据分析结果访问存储单元记录，检索或修改数据。 固件位于控制器内，控制控制器的操作，并可设置为测试模式或用户模式。 当固件从外部设备接收到测试命令并将固件设置为测试模式时，固件对存储单元进行缺陷测试，并通过连接器将缺陷测试结果发送到外部设备。