公开(公告)号：US11650405B2

公开(公告)日：2023-05-16

申请号：US17098058

申请日：2020-11-13

Applicant: SCOPIO LABS LTD.

Inventor： Ben Leshem ,  Eran Small ,  Erez Na'aman ,  Ittai Madar

IPC: G02B21/00 ,  G02B21/34 ,  G02B21/06 ,  G02B21/36

CPC classification number: G02B21/006 ,  G02B21/06 ,  G02B21/34 ,  G02B21/367

Abstract: A microscope for computational microscopic layer separation may include an imaging device that includes a lens and an image sensor, an illumination system for illuminating a sample, and an actuator to adjust an axial position of a focal plane with respect to the sample. The microscope may also include a processor operatively coupled to the imaging device and the illumination system. The processor may be configured to measure, using the image sensor and the illumination system, optical aberrations of the imaging device at the axial position, and determine whether to adjust the focal plane with respect to the sample in response to the one or more optical aberrations. Various other systems and methods are also disclosed.

公开(公告)号：US11409095B2

公开(公告)日：2022-08-09

申请号：US16875721

申请日：2020-05-15

Applicant: SCOPIO LABS LTD.

Inventor： Ittai Madar ,  Eran Small ,  Itai Hayut ,  Erez Na'aman

IPC: G02B21/06 ,  G02B21/36 ,  G02B21/00 ,  G02B21/12

Abstract: A microscope including an illumination assembly, an image capture device and a processor can be configured to selectively identify regions of a sample including artifacts or empty space. By selectively identifying regions of the sample that have artifacts or empty space, the amount of time to generate an image of the sample and resources used to generate the image can be decreased substantially while providing high resolution for appropriate regions of the computational image. The processor can be configured to change the imaging process in response to regions of the sample that includes artifacts or empty space. The imaging process may include a higher resolution process to output higher resolution portions of the computational image for sample regions including valid sample material, and a lower resolution process to output lower resolution portions of the computational image for sample regions including valid sample material.

公开(公告)号：US11828927B2

公开(公告)日：2023-11-28

申请号：US17812374

申请日：2022-07-13

Applicant: SCOPIO LABS LTD.

Inventor： Ittai Madar ,  Eran Small ,  Itai Hayut ,  Erez Na'Aman

IPC: G02B21/36 ,  G02B21/00 ,  G02B21/12

CPC classification number: G02B21/367 ,  G02B21/0084 ,  G02B21/125

Abstract: A microscope including an illumination assembly, an image capture device and a processor can be configured to selectively identify regions of a sample including artifacts or empty space. By selectively identifying regions of the sample that have artifacts or empty space, the amount of time to generate an image of the sample and resources used to generate the image can be decreased substantially while providing high resolution for appropriate regions of the computational image. The processor can be configured to change the imaging process in response to regions of the sample that includes artifacts or empty space. The imaging process may include a higher resolution process to output higher resolution portions of the computational image for sample regions including valid sample material, and a lower resolution process to output lower resolution portions of the computational image for sample regions including valid sample material.