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公开(公告)号:US20240204111A1
公开(公告)日:2024-06-20
申请号:US18066738
申请日:2022-12-15
IPC分类号: H01L29/808 , H01L21/04 , H01L29/16 , H01L29/66
CPC分类号: H01L29/8083 , H01L21/0465 , H01L29/1608 , H01L29/66068
摘要: A JFET transistor device having a reduced pitch may be manufactured using self-alignment techniques, while avoiding misalignments that may lead to decreased breakdown voltage and/or increased RDSon. Consequently, described devices provide, for a given active area and gate voltage, additional current channels, increased current, and reduced RDSon, as compared to conventional devices, while retaining high BVgs values.
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公开(公告)号:US20240153850A1
公开(公告)日:2024-05-09
申请号:US18053177
申请日:2022-11-07
IPC分类号: H01L23/482 , H01L21/82 , H01L23/532 , H01L27/082 , H01L27/088 , H01L29/16
CPC分类号: H01L23/4824 , H01L21/8213 , H01L23/53257 , H01L27/0823 , H01L27/088 , H01L29/1608
摘要: A semiconductor device may include a plurality of transistors, with a first array of low-resistance material formed in a first dielectric layer, with a gate subset of the first array formed on a plurality of gate electrodes of the transistors, and a source subset of the first array formed on a plurality of source regions of the transistors. A second array of low-resistance material may be formed in a second dielectric layer, with a gate subset of the second array formed on the gate subset of the first array and thereby electrically connected to the plurality of gate electrodes, and a source subset of the second array formed on the source subset of the first array and thereby electrically connected to the plurality of source regions.
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