THIN FILM TRANSISTOR AND METHOD OF FORMING THE SAME
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    发明申请
    THIN FILM TRANSISTOR AND METHOD OF FORMING THE SAME 有权
    薄膜晶体管及其形成方法

    公开(公告)号:US20110198603A1

    公开(公告)日:2011-08-18

    申请号:US12902786

    申请日:2010-10-12

    IPC分类号: H01L29/786 H01L21/336

    摘要: Disclosed are a thin film transistor and a method of forming the thin film transistor.The thin film transistor includes a gate electrode, an oxide semiconductor pattern, a first gate insulating layer pattern interposed between the gate electrode and the oxide semiconductor pattern, wherein the first gate insulating layer pattern has an island shape or has two portions of different thicknesses from each other, a source electrode and a drain electrode electrically connected to the oxide semiconductor pattern, wherein the source electrode and the drain electrode are separated from each other, and a first insulating layer pattern placed between the source electrode and drain electrode and the oxide semiconductor pattern, wherein the first insulating layer pattern partially contacts the source electrode and drain electrode and the first gate insulating layer pattern, and wherein the first insulating layer is enclosed by an outer portion.

    摘要翻译: 公开了薄膜晶体管和形成薄膜晶体管的方法。 薄膜晶体管包括栅电极,氧化物半导体图案,插入在栅极电极和氧化物半导体图案之间的第一栅极绝缘层图案,其中第一栅极绝缘层图案具有岛状或具有两个不同厚度的部分 电连接到所述氧化物半导体图案的源电极和漏电极,其中所述源电极和所述漏电极彼此分离;以及第一绝缘层图案,位于所述源电极和漏极之间以及所述氧化物半导体 图案,其中所述第一绝缘层图案部分地接触所述源电极和漏电极以及所述第一栅绝缘层图案,并且其中所述第一绝缘层被外部包围。