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公开(公告)号:US20240310339A1
公开(公告)日:2024-09-19
申请号:US18606770
申请日:2024-03-15
Applicant: SHIMADZU CORPORATION
Inventor: Satoshi SHIMIZU , Satoshi SUGIMOTO , Kenta ADACHI
IPC: G01N30/86
CPC classification number: G01N30/8641 , G01N30/8631
Abstract: A processor obtains a first correspondence in which at least one reference peak detected from reference chromatogram data and at least one target peak detected from target chromatogram data are brought in correspondence with each other, obtains a second correspondence in which a reference data set included in the reference chromatogram data and a target data set included in the target chromatogram data are brought in correspondence with each other, by using a first similarity between the second correspondence and the first correspondence, and corrects a time axis of the target chromatogram data in accordance with the second correspondence.
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2.
公开(公告)号:US20240296203A1
公开(公告)日:2024-09-05
申请号:US18418004
申请日:2024-01-19
Applicant: SHIMADZU CORPORATION
Inventor: Satoshi SHIMIZU , Shiori NAGAI , Kenta ADACHI
IPC: G06F17/18
CPC classification number: G06F17/18
Abstract: A data processing method according to one aspect of the present invention includes: a step of collecting an analysis file set including analysis data by an analyzer from a plurality of types of analyzers; a step of selecting a plurality of analysis file sets to be analyzed from the plurality of types of collected analysis file sets according to a narrowing-down condition received from a user; a step of extracting a plurality of features from each of the plurality of selected analysis file sets; a step of summarizing the plurality of features by performing statistical processing of the plurality of features; and a step of performing an analysis using the summarized features. The step of summarizing the plurality of features includes a step of presenting statistical information generated in the statistical processing to the user.
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公开(公告)号:US20230033480A1
公开(公告)日:2023-02-02
申请号:US17857316
申请日:2022-07-05
Applicant: SHIMADZU CORPORATION
Inventor: Yuriko NAKAKIMURA , Shiori NAGAI , Tomohiro KAWASE , Yusuke YOKOI , Satoshi YAMAMOTO , Kenta ADACHI
Abstract: A data processing apparatus according to one aspect is provided with an inference unit configured to predict at least one objective variable from a plurality of explanatory variables by using a trained model, and a display data generation unit configured to generate data for displaying an inference result by the inference unit. The inference unit is configured to set a first explanatory variable selected from the plurality of explanatory variables as a variation value and set second explanatory variables other than the first explanatory variable as fixed values. The inference unit predicts, by using the trained model, the at least one objective variable when the first explanatory variable is continuously varied within a predetermined variation range. The display data generation unit generates data indicating a variation of the at least one objective variable with respect to a variation of the first explanatory variable.
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4.
公开(公告)号:US20240320192A1
公开(公告)日:2024-09-26
申请号:US18585661
申请日:2024-02-23
Applicant: SHIMADZU CORPORATION
Inventor: Shiori NAGAI , Kenta ADACHI , Tomonori OSHIKAWA
IPC: G06F16/17
CPC classification number: G06F16/1734
Abstract: A data processing method includes a step for a computer to collect analysis file sets from a plurality of types of analyzers, the analysis file sets each including analysis data by the analyzer, and a step for the computer to tag each of a plurality of collected analysis file sets, the tag indicating a type of the analyzer, a material of a sample measured by the analyzer, preprocessing conditions of the sample, and measurement conditions of the sample.
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公开(公告)号:US20210356400A1
公开(公告)日:2021-11-18
申请号:US17317646
申请日:2021-05-11
Applicant: Shimadzu Corporation
Inventor: Yusuke YOKOI , Momoyo YAMAKAWA , Naoya FUJIWARA , Hiroaki TSUSHIMA , Kenta ADACHI
Abstract: A stress luminescence measurement device according to a first aspect is provided with a load application mechanism configured to deform a sample by applying a load to the sample, a light source configured to emit excitation light to a stress luminescent material 2 arranged on a surface of the sample, a camera configured to image luminescence of the stress luminescent material, and a controller configured to control the load application mechanism, the light source, and the camera. The controller acquires a deformation state of the sample at the imaging timing by the camera and stores the acquired deformation state of the sample in association with the image captured by the camera in a memory.
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公开(公告)号:US20240412343A1
公开(公告)日:2024-12-12
申请号:US18655982
申请日:2024-05-06
Applicant: SHIMADZU CORPORATION
Inventor: Kei AKUTSU , Ryuji SAWADA , Kenta ADACHI
Abstract: An image correction method according to this invention includes an image acquisition step, a background generation step of generating a plurality of background component images corresponding to different degrees of blurring in the object image, a selection step of selecting one background component image based on index values obtained based on the plurality of background component images, and an image correction step of generating a corrected object image based on the object image and the one background component image.
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7.
公开(公告)号:US20240320235A1
公开(公告)日:2024-09-26
申请号:US18586034
申请日:2024-02-23
Applicant: SHIMADZU CORPORATION
Inventor: Shiori NAGAI , Kenta ADACHI , Satoshi SHIMIZU , Tomoya TSUDA , Kei AKUTSU
CPC classification number: G06F16/254 , G06F16/13
Abstract: A data processing method includes a step for a computer to collect analysis file sets from multiple types of analyzers, the analysis file sets each including analysis data by the analyzer, a step for the computer to store the plurality of collected analysis file sets in a database with the analysis file sets sorted into corresponding collections for each material, and a step for the computer to form a subset by extracting an analysis file set in which a type of the analyzer, preprocessing conditions of a sample measured by the analyzer, and measurement conditions of the sample all match, from the collection.
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公开(公告)号:US20210372868A1
公开(公告)日:2021-12-02
申请号:US17322088
申请日:2021-05-17
Applicant: SHIMADZU CORPORATION
Inventor: Yusuke YOKOI , Momoyo YAMAKAWA , Naoya FUJIWARA , Kenta ADACHI , Hiroaki TSUSHIMA , Tomoki SASAYAMA
Abstract: Provided is a stress measurement device capable of easily grasping the behavior of a stress generation site in a sample. The stress measurement device is provided with a camera for imaging light emitted by a stress luminescent material, a controller for processing an image captured by the camera, and a display for displaying the image processed by the controller. The controller detects the stress generation site according to a luminescence distribution of the stress luminescent material for each of the plurality of time-series images captured by the camera and controls the display such that each stress generation site detected for each of the plurality of images is displayed on one image in a superimposed manner in mutually different display modes.
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