公开(公告)号：US20210356400A1

公开(公告)日：2021-11-18

申请号：US17317646

申请日：2021-05-11

Applicant: Shimadzu Corporation

Inventor： Yusuke YOKOI ,  Momoyo YAMAKAWA ,  Naoya FUJIWARA ,  Hiroaki TSUSHIMA ,  Kenta ADACHI

IPC: G01N21/70 ,  G01N3/32 ,  G01L1/24

Abstract: A stress luminescence measurement device according to a first aspect is provided with a load application mechanism configured to deform a sample by applying a load to the sample, a light source configured to emit excitation light to a stress luminescent material 2 arranged on a surface of the sample, a camera configured to image luminescence of the stress luminescent material, and a controller configured to control the load application mechanism, the light source, and the camera. The controller acquires a deformation state of the sample at the imaging timing by the camera and stores the acquired deformation state of the sample in association with the image captured by the camera in a memory.

公开(公告)号：US20230251130A1

公开(公告)日：2023-08-10

申请号：US18071620

申请日：2022-11-30

Applicant: SHIMADZU CORPORATION

Inventor： Naoya FUJIWARA ,  Yusuke AOI ,  Yuri ITO

IPC: G01J3/02 ,  G01N21/65 ,  G01N21/3563

CPC classification number: G01J3/027 ,  G01N21/65 ,  G01N21/3563

Abstract: An infrared Raman microscope capable of switching to and performing infrared spectroscopic analysis or Raman spectroscopic analysis for a sample on a stage includes an infrared light detection system, a Raman light detection system, a display unit, a display switching processing unit, and storage processing units. The infrared light detection system and the Raman light detection system photographs a visible image at different magnifications. The display unit displays the visible image of the sample in a display area in association with coordinates on the stage. The display switching processing unit switches and displays the visible image in the same image display area. In a case where a measurement position of the infrared spectroscopic analysis or the Raman spectroscopic analysis is designated on the display area, the storage processing units store a point of coordinates on the stage corresponding to the measurement position.

公开(公告)号：US20230194345A1

公开(公告)日：2023-06-22

申请号：US17994391

申请日：2022-11-28

Applicant: Shimadzu Corporation

Inventor： Naoya FUJIWARA ,  Yuri ITO

IPC: G01J3/28 ,  G01J3/44 ,  G01J3/02 ,  G01J3/10

CPC classification number: G01J3/2823 ,  G01J3/4412 ,  G01J3/0237 ,  G01J3/108 ,  G01J2003/106

Abstract: In a Raman microscope, a depth measurement processor performs depth measurement by changing a focal position of laser light along a depth direction of a sample which is an irradiation direction of the laser light with respect to the sample, and meanwhile, acquiring a Raman spectrum of the sample at a plurality of points in the depth direction. The display processor causes Raman spectra obtained at the plurality of points by the depth measurement to be displayed. The display processor can display a surface image of the sample on the stage and a depth image representing a plurality of points in the depth direction and causes, in a case where at least one point of the plurality of points in the depth image is selected, the Raman spectrum corresponding to the at least one point to be displayed.

公开(公告)号：US20230194339A1

公开(公告)日：2023-06-22

申请号：US17994387

申请日：2022-11-28

Applicant: Shimadzu Corporation

Inventor： Naoya FUJIWARA ,  Yuka MORITANI

IPC: G01J3/02 ,  G01J3/10 ,  G01J3/44 ,  G01J3/28

CPC classification number: G01J3/0237 ,  G01J3/108 ,  G01J3/4412 ,  G01J3/2823 ,  G01J2003/106

Abstract: In a Raman microscope, a depth measurement processor performs depth measurement by changing a focal position of laser light along a depth direction of a sample which is an irradiation direction of the laser light with respect to the sample, and meanwhile, acquiring a Raman spectrum of the sample at a plurality of points in the depth direction. A display processor displays an input screen used to input a parameter at a time of performing the depth measurement on the sample in association with a surface image of the sample on a stage. The parameter includes a range in which the focal position of the laser light is changed along the depth direction and an interval between the plurality of points within the range.

公开(公告)号：US20230251187A1

公开(公告)日：2023-08-10

申请号：US18075379

申请日：2022-12-05

Applicant: SHIMADZU CORPORATION

Inventor： Naoya FUJIWARA ,  Yusuke AOI

IPC: G01N21/35 ,  G01N21/65

CPC classification number: G01N21/35 ,  G01N21/65 ,  G01N2021/3595

Abstract: An infrared spectrum display processing unit performs processing of displaying an infrared spectrum obtained by infrared spectroscopic analysis in a graph representing a relationship between a wave number and intensity. A data conversion processing unit performs processing of converting a Raman spectrum obtained by Raman spectroscopic analysis into an equal interval Raman spectrum in which data points are plotted by wave numbers at equal intervals. A Raman spectrum display processing unit performs processing of displaying an equal interval Raman spectrum as a graph representing a relationship between a wave number and intensity.

公开(公告)号：US20230251135A1

公开(公告)日：2023-08-10

申请号：US18075392

申请日：2022-12-05

Applicant: SHIMADZU CORPORATION

Inventor： Naoya FUJIWARA ,  Yusuke AOI

IPC: G01J3/44 ,  G01J3/02 ,  G01N21/65

CPC classification number: G01J3/4412 ,  G01J3/0291 ,  G01N21/65

Abstract: An analysis result of an infrared spectrum at each measurement position is mapped and displayed in an infrared map display area as infrared data in association with a point of coordinates of each measurement position. An analysis result of a Raman spectrum at each measurement position is mapped and displayed in a Raman map display area as Raman data in association with a point of coordinates of each measurement position. In a case where an optional measurement position is designated in the infrared map display area and the Raman map display area, an infrared spectrum and a Raman spectrum associated with the designated measurement position are graphically displayed in the same graph display area.

公开(公告)号：US20210372868A1

公开(公告)日：2021-12-02

申请号：US17322088

申请日：2021-05-17

Applicant: SHIMADZU CORPORATION

Inventor： Yusuke YOKOI ,  Momoyo YAMAKAWA ,  Naoya FUJIWARA ,  Kenta ADACHI ,  Hiroaki TSUSHIMA ,  Tomoki SASAYAMA

IPC: G01L1/24 ,  G06T7/00 ,  H04N5/272 ,  G06T3/40 ,  G06T11/00

Abstract: Provided is a stress measurement device capable of easily grasping the behavior of a stress generation site in a sample. The stress measurement device is provided with a camera for imaging light emitted by a stress luminescent material, a controller for processing an image captured by the camera, and a display for displaying the image processed by the controller. The controller detects the stress generation site according to a luminescence distribution of the stress luminescent material for each of the plurality of time-series images captured by the camera and controls the display such that each stress generation site detected for each of the plurality of images is displayed on one image in a superimposed manner in mutually different display modes.